Surface and interface roughness in magnetic thin films: a comparison using carbon-nanotube atomic force microscopy and soft-x-ray scattering

2002 ◽  
Author(s):  
Bryan M. Barnes ◽  
F. Flack ◽  
John J. Kelly IV ◽  
Doug P. Lagally ◽  
Don E. Savage ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Magnetic Thin Films ◽  
Interface Roughness ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
X Ray Scattering ◽  
Atomic Force

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

1999 ◽  
Vol 38 (4) ◽  
pp. 684 ◽  
Author(s):  
Victor E. Asadchikov ◽  
Angela Duparré ◽  
Stefan Jakobs ◽  
Albert Yu. Karabekov ◽  
Igor V. Kozhevnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Surfaces ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers

1996 ◽  
Vol 156 (1-3) ◽  
pp. 109-110 ◽  
Author(s):  
K. Temst ◽  
M.J. Van Bael ◽  
D.G. de Groot ◽  
N.J. Koeman ◽  
R.P. Griessen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diffraction Study ◽  
Interface Roughness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force

scholarly journals CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

2001 ◽  
Vol 89 (8) ◽  
pp. 4670-4672 ◽  
Author(s):  
K. Bal ◽  
A. Kirilyuk ◽  
Th. Rasing ◽  
Y. Luo ◽  
K. Samwer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Interface Roughness ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

Intrinsic roughness and interfaces of Cr/Be multilayers

2021 ◽  
Vol 54 (6) ◽  
Author(s):  
Roman Pleshkov ◽  
Nikolay Chkhalo ◽  
Vladimir Polkovnikov ◽  
Mikhail Svechnikov ◽  
Maria Zorina
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Contrast ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Force Microscopy ◽  
Layer Material ◽  
Multilayer Mirror ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Sharp Structure

The structures of Cr/Be multilayer mirror interfaces are investigated using X-ray reflectometry, diffuse X-ray scattering and atomic force microscopy. The combination of these methods makes it possible to separate the contributions of roughness and interlayer diffusion/intermixing for each sample. In the range of period thicknesses of 2.26–0.8 nm, it is found that the growth roughness of the Cr/Be multilayer mirrors does not depend on the period thickness and is ∼0.2 nm. The separation of roughness and diffuseness allows estimation of layer material intermixing and the resulting drop in the optical contrast, which is from 0.85 to 0.17 in comparison with an ideally sharp structure.

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