Cryogenic optical system development for AEDC's 10V chamber

2002 ◽  
Author(s):  
Heard S. Lowry III ◽  
William R. Simpson ◽  
Randy A. Nicholson ◽  
Frank L. Crosswy ◽  
James D. Selman, Jr.
Keyword(s):  
Optical System ◽  
System Development

Interactive simulation-based optical system development

1995 ◽  
Author(s):  
Anees Ahmad ◽  
Chen Feng ◽  
RamaGopal V. Sarepaka
Keyword(s):  
Optical System ◽  
System Development ◽  
Interactive Simulation ◽  
Simulation Based

Optical system development for image converter tube photocathode illumination by femtosecond laser pulse

1997 ◽  
Author(s):  
Igor V. Galakhov ◽  
V. A. Eroshenko ◽  
L. V. L'vov ◽  
Vasili M. Murugov ◽  
A. V. Ryadov ◽  
...  
Keyword(s):  
Laser Pulse ◽  
Femtosecond Laser ◽  
Femtosecond Laser Pulse ◽  
Optical System ◽  
System Development ◽  
Image Converter

Optical system development and performance testing of the NEAR laser rangefinder

1996 ◽  
Author(s):  
Mark T. Boies ◽  
Timothy D. Cole ◽  
Ashruf S. El-Dinary ◽  
R. Alan Reiter
Keyword(s):  
Optical System ◽  
System Development ◽  
Performance Testing ◽  
Laser Rangefinder ◽  
And Performance

Minitype optical system development of stereo camera

2016 ◽  
Vol 45 (4) ◽  
pp. 0418002
Author(s):  
孟庆宇 Meng Qingyu ◽  
董吉洪 Dong Jihong ◽  
王栋 Wang Dong ◽  
赵伟国 Zhao Weiguo
Keyword(s):  
Optical System ◽  
System Development ◽  
Stereo Camera

A Field Emission System For Transmission Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 298-299
Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Optical System ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Objective Lens ◽  
Electron Optical System ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Emission System

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).

Information and estimation in image processing

1987 ◽  
Vol 45 ◽  
pp. 14-17
Author(s):  
B. Roy Frieden
Keyword(s):  
Image Processing ◽  
Optical System ◽  
Large Amplitude ◽  
Communication Theory ◽  
Image Data ◽  
Direct Approach ◽  
Ill Posed

Despite the skill and determination of electro-optical system designers, the images acquired using their best designs often suffer from blur and noise. The aim of an “image enhancer” such as myself is to improve these poor images, usually by digital means, such that they better resemble the true, “optical object,” input to the system. This problem is notoriously “ill-posed,” i.e. any direct approach at inversion of the image data suffers strongly from the presence of even a small amount of noise in the data. In fact, the fluctuations engendered in neighboring output values tend to be strongly negative-correlated, so that the output spatially oscillates up and down, with large amplitude, about the true object. What can be done about this situation? As we shall see, various concepts taken from statistical communication theory have proven to be of real use in attacking this problem. We offer below a brief summary of these concepts.

Cross-sectional TEM specimen preparation from magneto-optical disk by ultramicrotomy

1993 ◽  
Vol 51 ◽  
pp. 236-237
Author(s):  
F. Shaapur ◽  
M.J. Kim ◽  
Seh Kwang Lee ◽  
Soon Gwang Kim
Keyword(s):  
System Development ◽  
Thin Foil ◽  
Specimen Preparation ◽  
Material System ◽  
Cross Sectional ◽  
Protective Layers ◽  
New Material ◽  
Diamond Saw ◽  
Original Production ◽  
Thick Medium

TEM characterization and microanalysis of the recording media is crucial and complementary to new material system development as well as quality control applications. Due to the type of material generally used for supporting the medium, i.e., a polymer, conventional macro- and microthinning procedures for thin foil preparation are not applicable. Ultramicrotorny (UM) is a viable option and has been employed in previous similar studies. In this work UM has been used for preparation of XTEM samples from a magneto-optical (MO) recording medium in its original production format.The as-received material system consisted of a 4-layer, 2100 Å thick medium including a 300 Å TbFeCo layer enveloped by silicon nitride protective layers supported on a 1.2 mm thick × 135 mm (5.25 in.) diameter polycarbonate disk. Recording tracks had an approximate pitch of 1.6 μm separated by 800 Å deep peripheral grooves. Using a Buehler Isomet low-speed diamond saw, 1 mm wide and 20 mm long strips were cut out of the disk along the recording tracks.

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