X-ray characterization of PbSe/Si layers grown by pulsed laser ablation method
Proceedings of International Exchange and Innovation Conference on Engineering & Sciences (IEICES)
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2021 ◽
Vol 7
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pp. 190-179
2005 ◽
Vol 351
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pp. 116-123
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2011 ◽
Vol 8
(12)
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pp. 1146-1153
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2021 ◽
2000 ◽
Vol 114
(5)
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pp. 249-253
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