Three-dimensional sensing system with point light sources

2001 ◽  
Author(s):  
Toshifumi Tsukiyama ◽  
Yasuyo Kita
Keyword(s):  
Three Dimensional ◽  
Light Sources ◽  
Sensing System ◽  
Point Light

Development of a three-dimensional color rendition space for tunable solid-state light sources

2021 ◽  
Vol 2021 (29) ◽  
pp. 136-140
Author(s):  
Dorukalp Durmus
Keyword(s):  
Solid State ◽  
Dimensional Space ◽  
Three Dimensional ◽  
Color Discrimination ◽  
Continuous Measure ◽  
Light Sources ◽  
Vast Number ◽  
Lighting Systems ◽  
Single Number

The quality of building electric lighting systems can be assessed using color rendition metrics. However, color rendition metrics are limited in quantifying tunable solid-state light sources, since tunable lighting systems can generate a vast number of different white light spectra, providing flexibility in terms of color quality and energy efficiency. Previous research suggests that color rendition is multi-dimensional in nature, and it cannot be simplified to a single number. Color shifts under a test light source in comparison to a reference illuminant, changes in color gamut, and color discrimination are important dimensions of the quality of electric light sources, which are not captured by a single-numbered metric. To address the challenges in color rendition characterization of modern solid-state light sources, the development of a multi-dimensional color rendition space is proposed. The proposed continuous measure can quantify the change in color rendition ability of tunable solid-state light devices with caveats. Future work, discretization of the continuous color rendition space, will be carried out to address the shortcomings of a continuous three-dimensional space.

scholarly journals Optical Losses in Hybrid Microcavity Based in Porous Semiconductors and its Application as Optic Chemical Sensor

2019 ◽  
Vol 56 ◽  
pp. 158-167
Author(s):  
Claudia Antonio Hernández ◽  
Edith Osorio ◽  
Raúl Urteaga ◽  
Roberto Koropecki ◽  
José Alberto Alvarado ◽  
...  
Keyword(s):  
Chemical Sensor ◽  
Visible Region ◽  
Bragg Reflector ◽  
Resonant Peak ◽  
Light Sources ◽  
Optical Losses ◽  
Distributed Bragg Reflector ◽  
Nanoporous Anodic Alumina ◽  
Porous Semiconductors ◽  
Point Light

In this study the experimental and theoretical optical analysis of a hybrid microcavity (HM) based in porous silicon (PS) and nanoporous anodic alumina (NAA) are presented. The microcavity was centered in the visible region at 760 nm. Distributed Bragg reflector (DBR) was obtained using galvanostatic anodizing method and while NAA by the two-step anodization technique. From SEM micrographs the HM different regions are observed. HM optical characterization in the visible region was done, considering two different light sources, point and non-point respectively. These results reveal a decrease in the quality factor (Q) from 350 to 190 when the source is exchanged; this behavior has been mainly attributed to the light scattering at NAA. Furthermore, it was possible to study Q change, through transmittance simulation using the transfer matrix and Landau-Lifshitz-Looyenga theoretical methods. When a point light source is used, there are no optical losses making possible to sense 1% of analyte resulting in a 0.29 nm redshift of the resonant peak. According with these results we propose to apply the HM as chemical optic sensor.

scholarly journals Ultrafast nonlocal collective dynamics of Kane plasmon-polaritons in a narrow-gap semiconductor

2019 ◽  
Vol 5 (8) ◽  
pp. eaau9956 ◽  
Author(s):  
A. Charnukha ◽  
A. Sternbach ◽  
H. T. Stinson ◽  
R. Schlereth ◽  
C. Brüne ◽  
...  
Keyword(s):  
Fiber Optics ◽  
Near Field ◽  
Three Dimensional ◽  
Large Momentum ◽  
Light Sources ◽  
New States ◽  
High Bandwidth ◽  
And Control ◽  
2D And 3D ◽  
Plasmon Polaritons

The observation of ultrarelativistic fermions in condensed-matter systems has uncovered a cornucopia of novel phenomenology as well as a potential for effective ultrafast light engineering of new states of matter. While the nonequilibrium properties of two- and three-dimensional (2D and 3D) hexagonal crystals have been studied extensively, our understanding of the photoinduced dynamics in 3D single-valley ultrarelativistic materials is, unexpectedly, lacking. Here, we use ultrafast scanning near-field optical spectroscopy to access and control nonequilibrium large-momentum plasmon-polaritons in thin films of a prototypical narrow-bandgap semiconductor Hg0.81Cd0.19Te. We demonstrate that these collective excitations exhibit distinctly nonclassical scaling with electron density characteristic of the ultrarelativistic Kane regime and experience ultrafast initial relaxation followed by a long-lived highly coherent state. Our observation and ultrafast control of Kane plasmon-polaritons in a semiconducting material using light sources in the standard telecommunications fiber-optics window open a new avenue toward high-bandwidth coherent information processing in next-generation plasmonic circuits.

scholarly journals Micro-System Displacement and Profile Measurement By an Integrated Photon Tunneling and Confocal Microscope

2002 ◽  
Vol 18 (4) ◽  
pp. 173-183
Author(s):  
Wen-Jong Chen ◽  
Chih-Kung Lee ◽  
Shui-Shong Lu ◽  
Long-Sun Huang ◽  
Ta-Shun Chu ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Electrostatic Force ◽  
Three Dimensional ◽  
Confocal Laser Scanning Microscope ◽  
Confocal Laser ◽  
Profile Measurement ◽  
Light Sources ◽  
Halogen Lamp ◽  
Photon Tunneling ◽  
Micro Systems

ABSTRACTAn integrated optical method for measuring deformation of micro-mechanical systems with better than sub-micron resolutions is detailed. Both a confocal laser scanning microscope and a photon tunneling microscope were integrated into a single microscopy system due to their complimentary capabilities for examining sub-micrometer deformations. A halogen lamp and laser were adopted as the two light sources for the measurements. Since topographic information of samples up to a 15μm by 15μm area can be measured, a three-dimensional displacement field of the sample was extracted by comparing topographies of the same specimen area before and after deformation. The bending and twisting deformation of a micro-mirror driven by the electrostatic force was measured to demonstrate the capability of this newly developed instrument. The experimental data obtained agrees reasonably well with the theoretical results calculated by adopting an analytical solution and a finite element method. The small discrepancy in the result can be traced to the surface roughness effect, which is often non-negligible in micro-systems.

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