scholarly journals High-resolution hard x-ray and gamma-ray spectrometers based on superconducting absorbers coupled to superconducting transition edge sensors

2000 ◽  
Author(s):  
Marcel L. van den Berg ◽  
Daniel T. Chow ◽  
Alex Loshak ◽  
Mark F. Cunningham ◽  
Troy W. Barbee, Jr. ◽  
...  
Keyword(s):  
High Resolution ◽  
Gamma Ray ◽  
Transition Edge Sensors ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge

High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential

2015 ◽  
Vol 22 (3) ◽  
pp. 766-775 ◽  
Author(s):  
J. Uhlig ◽  
W. B. Doriese ◽  
J. W. Fowler ◽  
D. S. Swetz ◽  
C. Jaye ◽  
...  
Keyword(s):  
High Resolution ◽  
Emission Spectroscopy ◽  
Electronic Configuration ◽  
Transition Edge Sensors ◽  
Complex Compounds ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Wide Range ◽  
Low Efficiency

X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution because of the statistical limits described by Fano or too low counting rates to be of practical use. This paper updates an approach to high-resolution X-ray emission spectroscopy that uses a microcalorimeter detector array of superconducting transition-edge sensors (TESs). TES arrays are discussed and compared with conventional methods, and shown under which circumstances they are superior. It is also shown that a TES array can be integrated into a table-top time-resolved X-ray source and a soft X-ray synchrotron beamline to perform emission spectroscopy with good chemical sensitivity over a very wide range of energies.

scholarly journals High-resolution gamma-ray spectrometers using bulk absorbers coupled to Mo/Cu multilayer superconducting transition-edge sensors

2000 ◽  
Author(s):  
Daniel T. Chow ◽  
Alex Loshak ◽  
Marcel L. van den Berg ◽  
Matthias A. Frank ◽  
Troy W. Barbee, Jr. ◽  
...  
Keyword(s):  
High Resolution ◽  
Gamma Ray ◽  
Transition Edge Sensors ◽  
Superconducting Transition ◽  
Transition Edge ◽  
High Resolution Gamma

scholarly journals X-ray Microcalorimeter Based on Superconducting Transition Edge Sensors

2008 ◽  
Vol 24 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Masashi OHNO ◽  
Hiroyuki TAKAHASHI ◽  
R. M. Thushara DAMAYANTHI ◽  
Yasuhiro MINAMIKAWA ◽  
Fumiakira MORI
Keyword(s):  
Transition Edge Sensors ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge

scholarly journals Gamma-ray spectrometers using superconducting transition edge sensors with external active feedback bias

2001 ◽  
Vol 11 (1) ◽  
pp. 743-746 ◽  
Author(s):  
D.T. Chow ◽  
M.L. van den Berg ◽  
A. Loshak ◽  
M. Frank ◽  
T.W. Barbee ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Transition Edge Sensors ◽  
Superconducting Transition ◽  
Transition Edge ◽  
Active Feedback

scholarly journals A Review of X-ray Microcalorimeters Based on Superconducting Transition Edge Sensors for Astrophysics and Particle Physics

2021 ◽  
Vol 11 (9) ◽  
pp. 3793
Author(s):  
Luciano Gottardi ◽  
Kenichiro Nagayashi
Keyword(s):  
Low Temperature ◽  
Energy Resolution ◽  
Particle Physics ◽  
State Of The Art ◽  
Transition Edge Sensors ◽  
The State ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
The Way

The state-of-the-art technology of X-ray microcalorimeters based on superconducting transition-edge sensors (TESs), for applications in astrophysics and particle physics, is reviewed. We will show the advance in understanding the detector physics and describe the recent breakthroughs in the TES design that are opening the way towards the fabrication and the read-out of very large arrays of pixels with unprecedented energy resolution. The most challenging low temperature instruments for space- and ground-base experiments will be described.

scholarly journals Demonstration of MHz frequency domain multiplexing readout of 37 transition edge sensors for high-resolution x-ray imaging spectrometers

2021 ◽  
Vol 119 (18) ◽  
pp. 182601
Author(s):  
H. Akamatsu ◽  
D. Vaccaro ◽  
L. Gottardi ◽  
J. van der Kuur ◽  
C. P. de Vries ◽  
...  
Keyword(s):  
High Resolution ◽  
Frequency Domain ◽  
Transition Edge Sensors ◽  
X Ray ◽  
Frequency Domain Multiplexing ◽  
Transition Edge ◽  
X Ray Imaging

Energy calibration of superconducting transition edge sensors for x-ray detection using pulse analysis

2006 ◽  
Vol 77 (5) ◽  
pp. 053105 ◽  
Author(s):  
C. Hollerith ◽  
B. Simmnacher ◽  
R. Weiland ◽  
F. v. Feilitzsch ◽  
C. Isaila ◽  
...  
Keyword(s):  
Transition Edge Sensors ◽  
Energy Calibration ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Pulse Analysis

scholarly journals Electroplating Deposition of Bismuth Absorbers for X-ray Superconducting Transition Edge Sensors

Materials ◽  
2021 ◽  
Vol 14 (23) ◽  
pp. 7169
Author(s):  
Jian Chen ◽  
Jinjin Li ◽  
Xiaolong Xu ◽  
Zhenyu Wang ◽  
Siming Guo ◽  
...  
Keyword(s):  
Transition Edge Sensors ◽  
Rhombohedral Structure ◽  
Superconducting Transition ◽  
X Ray Diffraction ◽  
High Quantum Efficiency ◽  
X Ray ◽  
Transition Edge ◽  
Average Grain Size ◽  
Xrd Patterns ◽  
Electroplating Process

An absorber with a high absorbing efficiency is crucial for X-ray transition edge sensors (TESs) to realize high quantum efficiency and the best energy resolution. Semimetal Bismuth (Bi) has shown greater superiority than gold (Au) as the absorber due to the low specific heat capacity, which is two orders of magnitude smaller. The electroplating process of Bi films is investigated. The Bi grains show a polycrystalline rhombohedral structure, and the X-ray diffraction (XRD) patterns show a typical crystal orientation of (012). The average grain size becomes larger as the electroplating current density and the thickness increase, and the orientation of Bi grains changes as the temperature increases. The residual resistance ratio (RRR) (R300 K/R4.2 K) is 1.37 for the Bi film (862 nm) deposited with 9 mA/cm2 at 40 °C for 2 min. The absorptivity of the 5 μm thick Bi films is 40.3% and 30.7% for 10 keV and 15.6 keV X-ray radiation respectively, which shows that Bi films are a good candidate as the absorber of X-ray TESs.

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