Structural, infrared, x-ray photoelectron, and Raman spectral characterization of electrochromic nickel oxide films

2000 ◽  
Author(s):  
Yonggang Wu ◽  
Guangming Wu ◽  
Xingyuan Ni ◽  
Xiang Wu
Keyword(s):  
Nickel Oxide ◽  
Oxide Films ◽  
Spectral Characterization ◽  
X Ray ◽  
Raman Spectral ◽  
Nickel Oxide Films

Optical characterization of transparent nickel oxide films deposited by DC current reactive sputtering

2011 ◽  
Vol 519 (17) ◽  
pp. 5767-5770 ◽  
Author(s):  
A. Karpinski ◽  
N. Ouldhamadouche ◽  
A. Ferrec ◽  
L. Cattin ◽  
M. Richard-Plouet ◽  
...  
Keyword(s):  
Nickel Oxide ◽  
Oxide Films ◽  
Reactive Sputtering ◽  
Optical Characterization ◽  
Dc Current ◽  
Nickel Oxide Films

Characterization of Flexible Arrayed pH Sensor Based on Nickel Oxide Films

2018 ◽  
Vol 18 (2) ◽  
pp. 605-612 ◽  
Author(s):  
Jung-Chuan Chou ◽  
Siao-Jie Yan ◽  
Yi-Hung Liao ◽  
Chih-Hsien Lai ◽  
Jian-Syun Chen ◽  
...  
Keyword(s):  
Nickel Oxide ◽  
Ph Sensor ◽  
Oxide Films ◽  
Nickel Oxide Films

scholarly journals Strain analysis from M-edge resonant inelastic X-ray scattering of nickel oxide films

2019 ◽  
Vol 21 (38) ◽  
pp. 21596-21602
Author(s):  
P. S. Miedema ◽  
N. Thielemann-Kühn ◽  
I. Alonso Calafell ◽  
C. Schüßler-Langeheine ◽  
M. Beye
Keyword(s):  
Electronic Structure ◽  
Nickel Oxide ◽  
Crystal Field ◽  
Oxide Films ◽  
Strain Analysis ◽  
X Ray ◽  
X Ray Scattering ◽  
Nickel Oxide Films ◽  
Ray Scattering

3d-Metal M-edge RIXS quantitatively measures the electronic structure distortion due to strain with help of crystal field multiplet calculations.

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