scholarly journals Strain analysis from M-edge resonant inelastic X-ray scattering of nickel oxide films

2019 ◽  
Vol 21 (38) ◽  
pp. 21596-21602
Author(s):  
P. S. Miedema ◽  
N. Thielemann-Kühn ◽  
I. Alonso Calafell ◽  
C. Schüßler-Langeheine ◽  
M. Beye
Keyword(s):  
Electronic Structure ◽  
Nickel Oxide ◽  
Crystal Field ◽  
Oxide Films ◽  
Strain Analysis ◽  
X Ray ◽  
X Ray Scattering ◽  
Nickel Oxide Films ◽  
Ray Scattering

3d-Metal M-edge RIXS quantitatively measures the electronic structure distortion due to strain with help of crystal field multiplet calculations.

scholarly journals Effect of 3d/4p Mixing on 1s2p Resonant Inelastic X-ray Scattering: Electronic Structure of Oxo-Bridged Iron Dimers

2021 ◽  
Vol 143 (12) ◽  
pp. 4569-4584
Author(s):  
Thomas Kroll ◽  
Michael L. Baker ◽  
Samuel A. Wilson ◽  
Marcus Lundberg ◽  
Amélie Juhin ◽  
...  
Keyword(s):  
Electronic Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Strain Analysis in Thin La1−xCaxMnO3 Films by Grazing Incidence X-ray Scattering

1999 ◽  
Vol 602 ◽  
Author(s):  
M. Petit ◽  
L. J. Martinez-Miranda ◽  
M. Rajeswari ◽  
A. Biswas ◽  
D. J. Kang ◽  
...  
Keyword(s):  
Film Thickness ◽  
Lattice Mismatch ◽  
Compressive Strain ◽  
Strain Analysis ◽  
Grazing Incidence ◽  
Relaxation Processes ◽  
Near Surface ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractWe have performed depth profile analyses of the lattice parameters in epitaxial thin films of La1−xCaxMno3 (LCMO), where x = 0.33 or 0.3, to understand the evolution of strain relaxation processes in these materials. The analyses were done using Grazing Incidence X-ray Scattering (GIXS) on films of different thicnesses on two different substrates, (100) oriented LaAlO3 (LAO), with a lattice mismatch of ∼2% and (110) oriented NGO, with a lattice mismatch of less than 0.1%. Films grown on LAO can exhibit up to three in-plane strained lattice constants, corresponding to a slight orthorhombic distortion of the crystal, as well as near-surface and columnar lattice relaxation. As a function of film thickness, a crossover from a strained film to a mixture of strained and relaxed regions in the film occurs in the range of 700 Å. The structural evolution at this thickness coincides with a change in the resistivity curve near the metalinsulator transition. The in-plane compressive strain has a range of 0.2 – 1.5%, depending on the film thickness for filsm in the range of 400 - 1500 A.

“Building Block Picture” of the Electronic Structure of Aqueous Cysteine Derived from Resonant Inelastic Soft X-ray Scattering

2014 ◽  
Vol 118 (46) ◽  
pp. 13142-13150 ◽  
Author(s):  
F. Meyer ◽  
M. Blum ◽  
A. Benkert ◽  
D. Hauschild ◽  
S. Nagarajan ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Building Block ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Electronic Structure of Ni Complexes by X-ray Resonance Raman Spectroscopy (Resonant Inelastic X-ray Scattering)

2002 ◽  
Vol 124 (33) ◽  
pp. 9668-9669 ◽  
Author(s):  
Pieter Glatzel ◽  
Uwe Bergmann ◽  
Weiwei Gu ◽  
Hongxin Wang ◽  
Sergey Stepanov ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Electronic Structure ◽  
Resonance Raman Spectroscopy ◽  
Resonance Raman ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Electronic structure changes in cobalt phthalocyanine due to nanotube encapsulation probed using resonant inelastic X-ray scattering

2010 ◽  
Vol 12 (33) ◽  
pp. 9693 ◽  
Author(s):  
Janine C. Swarbrick ◽  
Tsu-Chien Weng ◽  
Karina Schulte ◽  
Andrei N. Khlobystov ◽  
Pieter Glatzel
Keyword(s):  
Electronic Structure ◽  
Cobalt Phthalocyanine ◽  
X Ray ◽  
X Ray Scattering ◽  
Structure Changes ◽  
Ray Scattering

Crystal-field excitations in multiferroic TbMnO3by Mn L3 and OKresonant inelastic X-ray scattering

2017 ◽  
Vol 122 (19) ◽  
pp. 194101
Author(s):  
Jiatai Feng ◽  
Amélie Juhin ◽  
Renaud Delaunay ◽  
Romain Jarrier ◽  
Nicolas Jaouen ◽  
...  
Keyword(s):  
Crystal Field ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Synchrotron x-ray scattering of magnetic and electronic structure of UN and U2N3 epitaxial films

2019 ◽  
Vol 100 (13) ◽  
Author(s):  
E. Lawrence Bright ◽  
R. Springell ◽  
D. G. Porter ◽  
S. P. Collins ◽  
G. H. Lander
Keyword(s):  
Electronic Structure ◽  
Epitaxial Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Electronic structure of Gd hydrides studied by resonant Inelastic soft X-ray scattering

2004 ◽  
Vol 137-140 ◽  
pp. 487-489
Author(s):  
K.O Kvashnina ◽  
S.M Butorin ◽  
J Nordgren ◽  
J.-H Guo ◽  
B Hjörvarsson
Keyword(s):  
Electronic Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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