Advanced methods for surface and subsurface defect characterization of optical components

2000 ◽  
Author(s):  
Joerg Steinert ◽  
Stefan Gliech ◽  
Andreas Wuttig ◽  
Angela Duparre ◽  
Horst Truckenbrodt
Keyword(s):  
Defect Characterization ◽  
Optical Components ◽  
Subsurface Defect

Defect characterization of CdTe thin films using a slow positron beam

2007 ◽  
Vol 4 (10) ◽  
pp. 3659-3663 ◽  
Author(s):  
S. Neretina ◽  
D. Grebennikov ◽  
R. A. Hughes ◽  
M. Weber ◽  
K. G. Lynn ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Beam ◽  
Defect Characterization ◽  
Slow Positron ◽  
Cdte Thin Films

Subwavelength Defect Characterization Using Guided Wave Scattering Matrix

2013 ◽  
Vol 330 ◽  
pp. 504-509
Author(s):  
Yang Zheng ◽  
Jin Jie Zhou ◽  
Hui Zheng
Keyword(s):  
Wave Scattering ◽  
Scattering Matrix ◽  
Guided Wave ◽  
Defect Characterization ◽  
Challenging Problem ◽  
Recognition Method ◽  
Quantitative Characterization ◽  
S Matrix ◽  
Imaging Algorithms

Although many imaging algorithms such as ellipse and hyperbola algorithm can roughly locate defects in large plate-like structures with sparse guided wave arrays, quantitative characterization of them is still a challenging problem, especially for those small defects known as subwavelength defects. Scattering signals of defects contain abundant information so that can be used to evaluate defects. A defects recognition method using the S-matrix (scattering matrix) was presented. S-matrices of hole and crack with S0 mode incident were experimentally measured. The results show that defects can be recognized from the morphology of 2D S-matrix chart. This method has great potential to achieve more specific parameters of small defects with sparse guided wave arrays.

scholarly journals The Low Density Matter (LDM) beamline at FERMI: optical layout and first commissioning

2015 ◽  
Vol 22 (3) ◽  
pp. 538-543 ◽  
Author(s):  
Cristian Svetina ◽  
Cesare Grazioli ◽  
Nicola Mahne ◽  
Lorenzo Raimondi ◽  
Claudio Fava ◽  
...  
Keyword(s):  
Transport System ◽  
Free Electron ◽  
Free Electron Laser ◽  
Low Density ◽  
Optical Components ◽  
Photon Transport ◽  
Physics Community ◽  
Optical Layout ◽  
Density Matter

The Low Density Matter (LDM) beamline has been built as part of the FERMI free-electron laser (FEL) facility to serve the atomic, molecular and cluster physics community. After the commissioning phase, it received the first external users at the end of 2012. The design and characterization of the LDM photon transport system is described, detailing the optical components of the beamline.

A multimodal method for defect characterization of large-aperture optics

2021 ◽  
Author(s):  
Jian Chen ◽  
Weiyang Yu ◽  
Haifeng Zhou ◽  
Jian Zhang ◽  
Xi Wang ◽  
...  
Keyword(s):  
Defect Characterization ◽  
Large Aperture ◽  
Multimodal Method

Defect Characterization of Sputter Deposited Au Contacts on N-TypeSi1-xGex

1997 ◽  
Vol 36 (Part 1, No. 2) ◽  
pp. 633-637
Author(s):  
Stewart A. Goodman ◽  
F. D. Auret
Keyword(s):  
Defect Characterization ◽  
Sputter Deposited

scholarly journals Comprehensive defect characterization of different iron samples after severe plastic deformation

2013 ◽  
Vol 443 ◽  
pp. 012033 ◽  
Author(s):  
Werner Puff ◽  
Xiang Zhou ◽  
Bernd Oberdorfer ◽  
Boris Scherwitzl ◽  
Peter Parz ◽  
...  
Keyword(s):  
Plastic Deformation ◽  
Severe Plastic Deformation ◽  
Defect Characterization
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