Electron-beam valves (EBVs): a new type of high-power device

2000 ◽  
Author(s):  
Vladimir I. Perevodchikov ◽  
V. N. Shapenko ◽  
V. F. Martynov ◽  
P. M. Stalkov ◽  
A. L. Shapiro
Keyword(s):  
Electron Beam ◽  
High Power ◽  
Power Device ◽  
New Type

scholarly journals Research of Parameters of the Powerful Electron Beam of Industrial Accelerator ELV

2019 ◽  
Vol 14 (2) ◽  
pp. 5-20
Author(s):  
E. V. Domarov ◽  
D. S. Vorobyov ◽  
M. G. Golkovsky ◽  
Yu. I. Golubenko ◽  
A. I. Korchagin ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Power ◽  
Factors Affecting ◽  
Gas Dynamic ◽  
Extraction Device ◽  
Dynamic Extraction ◽  
New Type ◽  
Accelerator Tube ◽  
Industrial Accelerator ◽  
Powerful Electron

This article deals the factors affecting the diameter and angle of divergence of the electron beam at the exit from the accelerator tube of an industrial ELV series accelerator. Measurements of the parameters of a high-power electron beam were carried out up to a power of 100 kW. On the basis of the data obtained, a new type of gas-dynamic extraction device was designed and pre-tested, which can efficiently output a focused electron beam to the atmosphere.

New type electron gun with electrostatic and electromagnetic lenses

1978 ◽  
Vol 36 (1) ◽  
pp. 62-63
Author(s):  
T. Ichinokawa ◽  
H. Maeda
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Optimum Condition ◽  
Bias Voltage ◽  
Electron Gun ◽  
Charge Effect ◽  
Micro Fabrication ◽  
Maximum Brightness ◽  
New Type ◽  
The Ideal

I. IntroductionThermionic electron gun with the Wehnelt grid is popularly used in the electron microscopy and electron beam micro-fabrication. It is well known that this gun could get the ideal brightness caluculated from the Lengumier and Richardson equations under the optimum condition. However, the design and ajustment to the optimum condition is not so easy. The gun has following properties with respect to the Wehnelt bias; (1) The maximum brightness is got only in the optimum bias. (2) In the larger bias than the optimum, the brightness decreases with increasing the bias voltage on account of the space charge effect. (3) In the smaller bias than the optimum, the brightness decreases with bias voltage on account of spreading of the cross over spot due to the aberrations of the electrostatic immersion lens.In the present experiment, a new type electron gun with the electrostatic and electromagnetic lens is designed, and its properties are examined experimentally.

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

On the dependence of the efficiency of a 240 GHz high-power gyrotron on the displacement of the electron beam and on the azimuthal index

2014 ◽  
Vol 21 (1) ◽  
pp. 013104 ◽  
Author(s):  
O. Dumbrajs ◽  
K. A. Avramidis ◽  
J. Franck ◽  
J. Jelonnek
Keyword(s):  
Electron Beam ◽  
High Power ◽  
Azimuthal Index

A Study on Process of Modular Li-Ion Power Batteries

2013 ◽  
Vol 273 ◽  
pp. 153-156
Author(s):  
Han Liang ◽  
Xiao Feng ◽  
Yuan An Li
Keyword(s):  
High Power ◽  
Internal Resistance ◽  
Power Battery ◽  
New Process ◽  
Good Consistency ◽  
New Type ◽  
Li Ion ◽  
Production Automation ◽  
The Way

Li-ion power battery which has a broad prospect of application in many industry fields is a new type of high power battery. The formation-testing and sorting-packing are necessary processes in battery manufacture. Currently the process of formation almost takes the way of monomer battery, then sorting and packing by measuring the parameters of its internal resistance, voltage and capacity. The operation is complicated and the amount of data is huge. On account of the problem, we propose a new process of battery modularization. It can greatly reduce the workload of the parameter testing when using the optimized process. And batteries can get a good consistency, which is favor of sorting-packing and production automation.

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