Absolute index of refraction and its temperature dependence of calcium fluoride, barium fluoride, and strontium fluoride near 157 nm

2000 ◽  
Author(s):  
John H. Burnett ◽  
Rajeev Gupta ◽  
Ulf Griesmann
Keyword(s):  
Temperature Dependence ◽  
Calcium Fluoride ◽  
Index Of Refraction ◽  
Barium Fluoride ◽  
Strontium Fluoride

Index of refraction and its temperature dependence of calcium fluoride near 157 nm

1999 ◽  
Author(s):  
John H. Burnett ◽  
Rajeev Gupta ◽  
Ulf Griesmann ◽  
Ted E. Jou
Keyword(s):  
Temperature Dependence ◽  
Calcium Fluoride ◽  
Index Of Refraction

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

Thermal expansion and index of refraction variation in barium fluoride

1981 ◽  
Vol 5 ◽  
pp. 625-628 ◽  
Author(s):  
T.S. Aurora ◽  
S.M. Day ◽  
T.E. Duerr ◽  
D.O. Pederson
Keyword(s):  
Thermal Expansion ◽  
Index Of Refraction ◽  
Barium Fluoride

scholarly journals Enhancement of luminescence in white emitting strontium fluoride core @ calcium fluoride shell nanoparticles

2015 ◽  
Vol 10 (1) ◽  
Author(s):  
Nandini Kumam ◽  
Ningthoujam Premananda Singh ◽  
Laishram Priyobarta Singh ◽  
Sri Krishna Srivastava
Keyword(s):  
Calcium Fluoride ◽  
Shell Nanoparticles ◽  
Strontium Fluoride
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