Multiply interconnected GaAs/AlGaAs quantum-well p-i-n-i-p-type diodes for high-performance all-optical bistable and oscillation device applications

2000 ◽  
Author(s):  
El-Hang Lee
Keyword(s):  
Quantum Well ◽  
High Performance ◽  
All Optical ◽  
Device Applications ◽  
P Type

Lattice-Matching Growth of InGaAIN Systems

1995 ◽  
Vol 395 ◽  
Author(s):  
Takashi Matsuoka
Keyword(s):  
High Performance ◽  
Ternary Alloys ◽  
Rocking Curve ◽  
Lattice Matching ◽  
Lattice Constants ◽  
Thermal Expansion Coefficients ◽  
Device Applications ◽  
Expansion Coefficients ◽  
P Type ◽  
Gan Film

ABSTRACTThe development and device applications of the InGaAIN system have progressed dramatically with improvements in crystalline quality by achieved through a buffer layer, the realization of p-type doping, and the growth of ternary alloys. As a substrate, sapphire is mainly used for epitaxial growth because of the lack of a GaN bulk crystal. However, many cracks in GaN film can still be observed and its X-ray rocking curve width is less than 100 arc seconds. This is are thought to be due to the lattice constants and thermal expansion coefficients of GaN and sapphire differ by 13.8% and by -34.2%, respectively. These values are extremely large in comparison with the corresponding values for InP and GaAs. Lattice-matching growth thus remains a basic problem in growing the high-quality epitaxial films necessary for high-performance devices.This paper reviews attempts at lattice-matching growth. Lattice-matching growth of InGaN on a house-made ZnO substrate and near-lattice-matching growth of GaN on SiC and NdGaO3 substrates have been proposed and performed, and the effects of lattice-matching have been confirmed. Various types of surface planes commercially available sapphire substrates are also discussed.

High performance InGaAsP/InP semiconductor quantum well lasers realized by gas source molecular beam epitaxy

1992 ◽  
Vol 2 (9) ◽  
pp. 1727-1738 ◽  
Author(s):  
A. Accard ◽  
F. Brillouet ◽  
E. Duda ◽  
B. Fernier ◽  
G. Gelly ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Quantum Well ◽  
High Performance ◽  
Molecular Beam ◽  
Quantum Well Lasers ◽  
Gas Source ◽  
Semiconductor Quantum Well

High performance 0.25 [micro sign]m p-type Ge/SiGe MODFETs

1998 ◽  
Vol 34 (19) ◽  
pp. 1888 ◽  
Author(s):  
G. Höck ◽  
T. Hackbarth ◽  
U. Erben ◽  
E. Kohn ◽  
U. König
Keyword(s):  
High Performance ◽  
P Type

P-type Co3O4 nanoarrays decorated on the surface of n-type flower-like WO3 nanosheets for high-performance gas sensing

2019 ◽  
Vol 288 ◽  
pp. 104-112 ◽  
Author(s):  
Yanghai Gui ◽  
Lele Yang ◽  
Kuan Tian ◽  
Hongzhong Zhang ◽  
Shaoming Fang
Keyword(s):  
High Performance ◽  
Gas Sensing ◽  
P Type ◽  
Co3o4 Nanoarrays

scholarly journals Nanonet: Low-temperature-processed tellurium nanowire network for scalable p-type field-effect transistors and a highly sensitive phototransistor array

2021 ◽  
Vol 13 (1) ◽  
Author(s):  
Muhammad Naqi ◽  
Kyung Hwan Choi ◽  
Hocheon Yoo ◽  
Sudong Chae ◽  
Bum Jun Kim ◽  
...  
Keyword(s):  
Low Temperature ◽  
Field Effect ◽  
High Performance ◽  
Field Effect Transistors ◽  
Optical Measurements ◽  
Electrical Performance ◽  
Large Area ◽  
Nanowire Network ◽  
P Type ◽  
Nanowire Networks

AbstractLow-temperature-processed semiconductors are an emerging need for next-generation scalable electronics, and these semiconductors need to feature large-area fabrication, solution processability, high electrical performance, and wide spectral optical absorption properties. Although various strategies of low-temperature-processed n-type semiconductors have been achieved, the development of high-performance p-type semiconductors at low temperature is still limited. Here, we report a unique low-temperature-processed method to synthesize tellurium nanowire networks (Te-nanonets) over a scalable area for the fabrication of high-performance large-area p-type field-effect transistors (FETs) with uniform and stable electrical and optical properties. Maximum mobility of 4.7 cm2/Vs, an on/off current ratio of 1 × 104, and a maximum transconductance of 2.18 µS are achieved. To further demonstrate the applicability of the proposed semiconductor, the electrical performance of a Te-nanonet-based transistor array of 42 devices is also measured, revealing stable and uniform results. Finally, to broaden the applicability of p-type Te-nanonet-based FETs, optical measurements are demonstrated over a wide spectral range, revealing an exceptionally uniform optical performance.

SiC Epitaxial Layers Grown by Sublimation Method and their Electrical Properties

2007 ◽  
Vol 556-557 ◽  
pp. 153-156
Author(s):  
Chi Kwon Park ◽  
Gi Sub Lee ◽  
Ju Young Lee ◽  
Myung Ok Kyun ◽  
Won Jae Lee ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Epitaxial Layer ◽  
Light Emission ◽  
Epitaxial Layers ◽  
Current Voltage ◽  
Space Technique ◽  
Sublimation Method ◽  
Device Applications ◽  
P Type ◽  
Surface Morphologies

A sublimation epitaxial method, referred to as the Closed Space Technique (CST) was adopted to produce thick SiC epitaxial layers for power device applications. In this study, we aimed to systematically investigate surface morphologies and electrical properties of SiC epitaxial layers grown with varying a SiC/Al ratio in a SiC source powder during the sublimation growth using the CST method. It was confirmed that the acceptor concentration of epitaxial layer was continuously decreased with increasing the SiC/Al ratio. The blue light emission was successfully observed on a PN diode structure fabricated with the p-type SiC epitaxial layer. Furthermore, 4H-SiC MESFETs having a micron-gate length were fabricated using a lithography process and their current-voltage performances were characterized.

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