<title>Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry</title>

Retraction: “Depth Profile Characterization of Spin-Coated Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonic acid) Films for Thin-Film Solar Cells during Argon Plasma Etching by Spectroscopic Ellipsometry”

Japanese Journal of Applied Physics ◽

10.7567/jjap.55.089201 ◽

2016 ◽

Vol 55 (8) ◽

pp. 089201

Author(s):

Tomohisa Ino ◽

Tatsuya Hayashi ◽

Keiji Ueno ◽

Hajime Shirai

Keyword(s):

Thin Film ◽

Solar Cells ◽

Depth Profile ◽

Plasma Etching ◽

Spectroscopic Ellipsometry ◽

Sulfonic Acid ◽

Argon Plasma ◽

Thin Film Solar Cells ◽

Styrene Sulfonic Acid

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Spectroscopic ellipsometry characterization of thin film photovoltaic materials and devices

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) ◽

10.1109/pvsc.2013.6744416 ◽

2013 ◽

Author(s):

Michelle N. Sestak ◽

Li Yan ◽

Celine Eypert

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Photovoltaic Materials

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Spectroscopic Ellipsometry Characterization of Pd Thin Film Grown by Atomic Layer Deposition

ECS Meeting Abstracts ◽

10.1149/ma2015-02/26/1003 ◽

2015 ◽

Keyword(s):

Thin Film ◽

Atomic Layer Deposition ◽

Spectroscopic Ellipsometry ◽

Atomic Layer ◽

Layer Deposition

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Thermal and optical characterization of push–pull azo dye-doped poly(methylmethacrylate) thin film as short wavelength optical recording media

Materials Science and Engineering B ◽

10.1016/s0921-5107(99)00180-4 ◽

1999 ◽

Vol 65 (2) ◽

pp. 75-78 ◽

Cited By ~ 9

Author(s):

Guangbin Wang ◽

Lisong Hou ◽

Fuxi Gan

Keyword(s):

Thin Film ◽

Short Wavelength ◽

Azo Dye ◽

Optical Characterization ◽

Optical Recording ◽

Recording Media

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Spectroscopic ellipsometry investigation of azo dye and azo dye doped polymer

The European Physical Journal Applied Physics ◽

10.1051/epjap:2006129 ◽

2006 ◽

Vol 37 (1) ◽

pp. 61-64 ◽

Cited By ~ 6

Author(s):

O. Taqatqa ◽

H. Al Attar

Keyword(s):

Spectroscopic Ellipsometry ◽

Azo Dye ◽

Doped Polymer

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Optical characterization of a four-medium thin film structure by real time spectroscopic ellipsometry: amorphous carbon on tantalum

Applied Optics ◽

10.1364/ao.30.002692 ◽

1991 ◽

Vol 30 (19) ◽

pp. 2692 ◽

Cited By ~ 39

Author(s):

Yue Cong ◽

IIsin An ◽

K. Vedam ◽

Robert W. Collins

Keyword(s):

Thin Film ◽

Real Time ◽

Amorphous Carbon ◽

Spectroscopic Ellipsometry ◽

Optical Characterization ◽

Film Structure ◽

Thin Film Structure

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Characterization of polycrystalline silicon thin-film multilayers by variable angle spectroscopic ellipsometry

Surface and Interface Analysis ◽

10.1002/sia.740180209 ◽

1992 ◽

Vol 18 (2) ◽

pp. 113-118 ◽

Cited By ~ 20

Author(s):

Paul G. Snyder ◽

Yi-Ming Xiong ◽

John A. Woollam ◽

Eric R. Krosche ◽

Yale Strausser

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Variable Angle ◽

Variable Angle Spectroscopic Ellipsometry

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Optical parameters and absorption studies of azo dye-doped polymer thin films on silicon

Materials Letters ◽

10.1016/s0167-577x(99)00219-0 ◽

2000 ◽

Vol 43 (1-2) ◽

pp. 6-10 ◽

Cited By ~ 13

Author(s):

Guangbin Wang ◽

Fuxi Gan

Keyword(s):

Thin Films ◽

Azo Dye ◽

Polymer Thin Films ◽

Optical Parameters ◽

Absorption Studies ◽

Doped Polymer

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Evaluation of optical parameters and characterization of ultrasonically sprayed MgO films by spectroscopic ellipsometry

Applied Surface Science ◽

10.1016/j.apsusc.2012.11.089 ◽

2013 ◽

Vol 265 ◽

pp. 709-713 ◽

Cited By ~ 12

Author(s):

S. Kurtaran ◽

I. Akyuz ◽

F. Atay

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Parameters

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Spectroscopic Ellipsometry Characterization of Hydrogenated Amorphous Silicon Thin Film

Acta Optica Sinica ◽

10.3788/aos201333.1031001 ◽

2013 ◽

Vol 33 (10) ◽

pp. 1031001

Author(s):

何剑 He Jian ◽

李伟 Li Wei ◽

徐睿 Xu Rui ◽

郭安然 Guo Anran ◽

祁康成 Qi Kangcheng ◽

...

Keyword(s):

Thin Film ◽

Amorphous Silicon ◽

Spectroscopic Ellipsometry ◽

Hydrogenated Amorphous Silicon ◽

Silicon Thin Film ◽

Hydrogenated Amorphous

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