Quantitative damage morphology analysis of laser-induced surface cracks in fused silica at 355 nm

Author(s):  
Francois Y. Genin ◽  
Jack H. Campbell ◽  
J. M. Yoshiyama ◽  
Alberto Salleo ◽  
Timothy Sands
2018 ◽  
Vol 15 (10) ◽  
pp. 106001
Author(s):  
Xiang Gao ◽  
Rong Qiu ◽  
Ke Yao ◽  
Yun Luo ◽  
Guorui Zhou ◽  
...  

2016 ◽  
Vol 362 ◽  
pp. 290-296 ◽  
Author(s):  
R. Diaz ◽  
M. Chambonneau ◽  
P. Grua ◽  
J.-L. Rullier ◽  
J.-Y. Natoli ◽  
...  

2017 ◽  
Vol 64 ◽  
pp. 295-301 ◽  
Author(s):  
X. Gao ◽  
Y. Jiang ◽  
R. Qiu ◽  
Q. Zhou ◽  
R. Zuo ◽  
...  

2010 ◽  
Vol 42 (9) ◽  
pp. 1465-1468 ◽  
Author(s):  
Guohang Hu ◽  
Yuanan Zhao ◽  
Dawei Li ◽  
Qiling Xiao ◽  
Jianda Shao ◽  
...  

Inventions ◽  
2017 ◽  
Vol 2 (3) ◽  
pp. 15 ◽  
Author(s):  
Georg Schnurbusch ◽  
Ekkard Brinksmeier ◽  
Oltmann Riemer

2014 ◽  
Author(s):  
Maxime Chambonneau ◽  
Romain Diaz ◽  
Guillaume Duchateau ◽  
Pierre Grua ◽  
Jean-Yves Natoli ◽  
...  

Open Physics ◽  
2017 ◽  
Vol 15 (1) ◽  
pp. 233-239 ◽  
Author(s):  
Xiang Gao ◽  
Rong Qiu ◽  
Kunpeng Wang ◽  
Jiangmei Zhang ◽  
Guorui Zhou ◽  
...  

AbstractA model for predicting the size ranges of different potential inclusions initiating damage on the surface of fused silica has been presented. This accounts for the heating of nanometric inclusions whose absorptivity is described based on Mie Theory. The depth profile of impurities has been measured by ICP-OES. By the measured temporal pulse profile on the surface of fused silica, the temperature and thermal stress has been calculated. Furthermore, considering the limit conditions of temperature and thermal stress strength for different damage morphologies, the size range of potential inclusions for fused silica is discussed.


2020 ◽  
Vol 28 (3) ◽  
pp. 3942
Author(s):  
Chengyu Zhu ◽  
Lingxi Liang ◽  
Hang Yuan ◽  
Luoxian Zhou ◽  
Yuxin Li ◽  
...  

2013 ◽  
Author(s):  
Qiang Cheng ◽  
Jin Huang ◽  
Xinda Zhou ◽  
Laixi Sun ◽  
Xiaodong Jiang ◽  
...  

2017 ◽  
Vol 25 (13) ◽  
pp. 15161 ◽  
Author(s):  
S. Ly ◽  
N. Shen ◽  
R. A. Negres ◽  
C. W. Carr ◽  
D. A. Alessi ◽  
...  

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