Digital speckle pattern interferometry (DSPI) using optical polarization phase shift for measurement of temperature field in thermal flow

1997 ◽  
Author(s):  
Yaozu Song ◽  
Ying Wu ◽  
Rudi Kulenovic ◽  
Zengyuan Guo ◽  
Manfred Groll
Keyword(s):  
Temperature Field ◽  
Phase Shift ◽  
Speckle Pattern ◽  
Optical Polarization ◽  
Thermal Flow ◽  
Digital Speckle Pattern Interferometry ◽  
Digital Speckle ◽  
Polarization Phase

scholarly journals Measurement of In-Plane Displacement in Two Orthogonal Directions by Digital Speckle Pattern Interferometry

2019 ◽  
Vol 9 (18) ◽  
pp. 3882
Author(s):  
Peizheng Yan ◽  
Xiangwei Liu ◽  
Fangyuan Sun ◽  
Qihan Zhao ◽  
Shimin Zhong ◽  
...  
Keyword(s):  
Phase Shift ◽  
Simultaneous Measurement ◽  
Carrier Phase ◽  
Speckle Pattern ◽  
Polarization Property ◽  
The Other ◽  
Digital Speckle Pattern Interferometry ◽  
Digital Speckle ◽  
Plane Displacement ◽  
Shift Technique

The measurement of in-plane displacement in two orthogonal directions is of considerable significance for modern industries. This paper reports on a spatial carrier phase-shift digital speckle pattern interferometry (DSPI) for the simultaneous measurement of in-plane displacement in two orthogonal directions. The object is illuminated from a single direction and observed from four symmetrical directions simultaneously. One pair of the four observation directions is sensitive to in-plane displacement in one direction, and the other pair is sensitive to in-plane displacement in the perpendicular direction, resulting in the displacement in two directions being measured independently. The polarization property of light is used to avoid cross-interference between the two pairs of beams. Spatial carrier frequencies are generated by aperture misalignment, and the displacement in two directions is modulated onto the same interferogram. With a spatial carrier phase-shift technique, the displacement can be separated in the frequency domain and the phase can be evaluated from a single interferogram in real time. The capability of DSPI is described by theoretical discussions and experiments.

Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement

2017 ◽  
Vol 56 (6) ◽  
pp. 066107 ◽  
Author(s):  
Xinya Gao ◽  
Yonghong Wang ◽  
Junrui Li ◽  
Xizuo Dan ◽  
Sijin Wu ◽  
...  
Keyword(s):  
Speckle Pattern ◽  
Three Dimensional ◽  
Deformation Measurement ◽  
Digital Speckle Pattern Interferometry ◽  
Digital Speckle
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