scholarly journals Thick silicate glass film for a waveguide

1997 ◽  
Author(s):  
Masayuki Yamane ◽  
Shuichi Shibata ◽  
Tetsuji Yano ◽  
Kenichi Watanabe
Keyword(s):  
Silicate Glass ◽  
Glass Film

Sputtered Lead Silicate Glass Film for Multilevel Interconnections

1983 ◽  
Vol 22 (S1) ◽  
pp. 167
Author(s):  
Kinya Kato ◽  
Keizo Shuto ◽  
Masahiko Hasegawa
Keyword(s):  
Silicate Glass ◽  
Lead Silicate ◽  
Glass Film ◽  
Lead Silicate Glass

Sputtered Lead Silicate Glass Film for Multilevel Interconnections

1982 ◽  
Author(s):  
Kinya Kato ◽  
Keizo Shuto ◽  
Masahiko Hasegawa
Keyword(s):  
Silicate Glass ◽  
Lead Silicate ◽  
Glass Film ◽  
Lead Silicate Glass

Optical bonding of tellurite glass film on silicate glass

2018 ◽  
Author(s):  
Ray‐Jay Jeng ◽  
Tetsuo Kishi ◽  
Nobuhiro Matsushita ◽  
Tetsuji Yano
Keyword(s):  
Silicate Glass ◽  
Tellurite Glass ◽  
Glass Film

Effect of Aluminum on the Formation of Silver Metal Quantum Dots in Sol–Gel Derived Alumino-Silicate Glass Film

2006 ◽  
Vol 6 (11) ◽  
pp. 3399-3403 ◽  
Author(s):  
Bok Hyeon Kim ◽  
Dong Hoon Son ◽  
Seongmin Ju ◽  
Chaehwan Jeong ◽  
Seongjae Boo ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Silicate Glass ◽  
Glass Structure ◽  
Sol Gel ◽  
Glass Plate ◽  
Aluminum Concentration ◽  
Glass Film ◽  
Aluminum Ions ◽  
Alumino Silicate ◽  
Silver Metal

The effect of aluminum incorporation on silver metal quantum dots formation in the alumino-silicate glass film processed by sol–gel process was investigated. The sol–gel derived glass was coated onto the silica glass plate by spin coating with the mixture solution of tetraethyl orthosilicate (TEOS), C2H5OH, H2O, AgNO3, Al(NO3)3·9H2O, and HNO3 with the molar ratios of Ag/Si = 0.12 and Al/Si varying from 0 to 0.12. The formation of the silver metal quantum dots was confirmed by the measurements of the UV/VISoptical spectra, the X-ray diffraction patterns, and the transmission electron microscope images. While the radius of silver metal quantum dots increased with the increase of aluminum concentration, the concentration of the silver metal quantum dots decreased. The formation of the silver metal quantum dots was found strongly suppressed by incorporation of aluminum ions in the glass. The change in the glass structure due to the aluminum incorporation was investigated by the analysis of the Raman spectra. The silver ions in the glass contributed to form stable (Al:Ag)O4 tetrahedra by pairing with aluminum ions and thus clustering of silver metal quantum dots was hindered.

Thick silicate glass film by an interfacial polymerization

1994 ◽  
Vol 2 (1-3) ◽  
pp. 457-460 ◽  
Author(s):  
M. Yamane ◽  
S. Shibata ◽  
A. Yasumori ◽  
T. Yano ◽  
S. Uchihiro
Keyword(s):  
Silicate Glass ◽  
Interfacial Polymerization ◽  
Glass Film
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