Radiation effects in the investigation of threshold gain and threshold current of circular-grating surface-emitting lasers

1997 ◽  
Author(s):  
Ali M. Shams-Zadeh-Amiri ◽  
Wei-Ping Huang
Keyword(s):  
Radiation Effects ◽  
Threshold Current ◽  
Surface Emitting Lasers ◽  
Emitting Lasers ◽  
Circular Grating ◽  
Threshold Gain

Threshold gain analysis in GaN-based photonic crystal surface emitting lasers

2011 ◽  
Vol 36 (10) ◽  
pp. 1908 ◽  
Author(s):  
Peng-Hsiang Weng ◽  
Tzeng-Tsong Wu ◽  
Tien-Chang Lu ◽  
Shing-Chung Wang
Keyword(s):  
Photonic Crystal ◽  
Crystal Surface ◽  
Surface Emitting Lasers ◽  
Emitting Lasers ◽  
Threshold Gain

THERMAL EFFECTS IN VERTICAL-CAVITY SURFACE-EMITTING LASERS

1994 ◽  
Vol 05 (04) ◽  
pp. 667-730 ◽  
Author(s):  
MAREK OSIŃSKI ◽  
WŁODZIMIERZ NAKWASKI
Keyword(s):  
Thermal Modeling ◽  
Longitudinal Mode ◽  
Transverse Mode ◽  
Threshold Current ◽  
Cavity Surface ◽  
Relative Distribution ◽  
Surface Emitting Lasers ◽  
Vertical Cavity Surface ◽  
Emitting Lasers ◽  
Vertical Cavity

A comprehensive review of temperature-related effects and thermal modeling of vertical-cavity surface-emitting lasers (VCSELs) is presented. The paper is divided into two major parts. First, the effects of temperature on device characteristics are discussed, including the temperature dependence of the longitudinal mode spectra, the threshold current, the transverse-mode structure, and the output power. A new condition is formulated for thermal matching of the Bragg mirrors and the spacer region and a comparison is made between characteristic temperatures for the threshold current (T0) and for the external quantum efficiency (Tη). In the second part, various approaches to thermal modeling of VCSELs are described. Both simplified and comprehensive thermal models are considered and both analytical and numerical approaches are discussed. A new analytical approximate method for analysis of heat-flux spreading in multilayer structures is described. The most important results obtained with the aid of these models are presented. In particular, we show that the current dependence of thermal resistance is very sensitive to VCSEL structure, and is strongly influenced by the relative distribution of heat sources and their location with respect to the heat sink.

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