Radiographic imaging characteristics of a direct conversion detector using selenium and thin film transistor array

1997 ◽  
Author(s):  
Denny L. Y. Lee ◽  
Lawrence K. Cheung ◽  
Lothar S. Jeromin ◽  
Eugene F. Palecki ◽  
Brian G. Rodricks
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Direct Conversion ◽  
Radiographic Imaging ◽  
Imaging Characteristics

X-ray imaging characteristics of a direct conversion detector using selenium and thin film transistor array

1997 ◽  
Author(s):  
Brian Rodricks ◽  
Denny L. Lee ◽  
Lawrence K. Cheung ◽  
Lothar S. Jeromin ◽  
Eugene F. Palecki
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Direct Conversion ◽  
X Ray ◽  
Imaging Characteristics ◽  
X Ray Imaging

Thin-film transistor array technology for high-performance direct-conversion x-ray sensors

1998 ◽  
Author(s):  
Willem den Boer ◽  
Steven Aggas ◽  
Young H. Byun ◽  
Tieer Gu ◽  
Johnny Q. Zhong ◽  
...  
Keyword(s):  
Thin Film ◽  
High Performance ◽  
Thin Film Transistor ◽  
Direct Conversion ◽  
X Ray ◽  
Array Technology

Effect of transient behavior on off-state current in poly-Si junctionless nanowire thin-film transistor

2020 ◽  
Vol 59 (12) ◽  
pp. 126503
Author(s):  
Tsung-Kuei Kang ◽  
Che-Fu Hsu ◽  
Han-Wen Liu ◽  
Feng-Tso Chien ◽  
Cheng-Li Lin
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Transient Behavior

Laser annealing of metal oxide thin film transistor

2020 ◽  
Vol 35 (12) ◽  
pp. 1211-1221
Author(s):  
Hong-long NING ◽  
◽  
Yu-xi DENG ◽  
Jian-lang HUANG ◽  
Zi-long LUO ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Laser Annealing ◽  
Thin Film Transistor ◽  
Oxide Thin Film ◽  
Metal Oxide Thin Film

Improved Thin-Film Transistor Performance Through a Melt of Poly(para-phenyleneethynylene)

2014 ◽  
Vol 35 (20) ◽  
pp. 1770-1775 ◽  
Author(s):  
Stefanie Schmid ◽  
Anne K. Kast ◽  
Rasmus R. Schröder ◽  
Uwe H. F. Bunz ◽  
Christian Melzer
Keyword(s):  
Thin Film ◽  
Thin Film Transistor

scholarly journals Influence of Active Channel Layer Thickness on SnO2 Thin-Film Transistor Performance

Electronics ◽  
2021 ◽  
Vol 10 (2) ◽  
pp. 200
Author(s):  
Do Won Kim ◽  
Hyeon Joong Kim ◽  
Changmin Lee ◽  
Kyoungdu Kim ◽  
Jin-Hyuk Bae ◽  
...  
Keyword(s):  
Thin Film ◽  
Field Effect ◽  
Thin Film Transistor ◽  
Sol Gel ◽  
Precursor Concentration ◽  
Sno2 Thin Film ◽  
Field Effect Mobility ◽  
Si Substrates ◽  
Channel Layer ◽  
Active Channel

Sol-gel processed SnO2 thin-film transistors (TFTs) were fabricated on SiO2/p+ Si substrates. The SnO2 active channel layer was deposited by the sol-gel spin coating method. Precursor concentration influenced the film thickness and surface roughness. As the concentration of the precursor was increased, the deposited films were thicker and smoother. The device performance was influenced by the thickness and roughness of the SnO2 active channel layer. Decreased precursor concentration resulted in a fabricated device with lower field-effect mobility, larger subthreshold swing (SS), and increased threshold voltage (Vth), originating from the lower free carrier concentration and increase in trap sites. The fabricated SnO2 TFTs, with an optimized 0.030 M precursor, had a field-effect mobility of 9.38 cm2/Vs, an SS of 1.99, an Ion/Ioff value of ~4.0 × 107, and showed enhancement mode operation and positive Vth, equal to 9.83 V.

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