Structured illumination microscopy and super-resolution image reconstruction

2021 ◽  
Author(s):  
Ying Bi ◽  
Jiaming Qian ◽  
Yu Cao
2016 ◽  
Vol 09 (03) ◽  
pp. 1630002 ◽  
Author(s):  
Qiang Yang ◽  
Liangcai Cao ◽  
Hua Zhang ◽  
Hao Zhang ◽  
Guofan Jin

The image reconstruction process in super-resolution structured illumination microscopy (SIM) is investigated. The structured pattern is generated by the interference of two Gaussian beams to encode undetectable spectra into detectable region of microscope. After parameters estimation of the structured pattern, the encoded spectra are computationally decoded and recombined in Fourier domain to equivalently increase the cut-off frequency of microscope, resulting in the extension of detectable spectra and a reconstructed image with about two-fold enhanced resolution. Three different methods to estimate the initial phase of structured pattern are compared, verifying the auto-correlation algorithm affords the fast, most precise and robust measurement. The artifacts sources and detailed reconstruction flowchart for both linear and nonlinear SIM are also presented.


2020 ◽  
Author(s):  
Zafran Hussain Shah ◽  
Marcel Müller ◽  
Tung-Cheng Wang ◽  
Philip Maurice Scheidig ◽  
Axel Schneider ◽  
...  

AbstractSuper-resolution structured illumination microscopy (SR-SIM) provides an up to two-fold enhanced spatial resolution of fluorescently labeled samples. The reconstruction of high quality SR-SIM images critically depends on patterned illumination with high modulation contrast. Noisy raw image data, e.g. as a result of low excitation power or low exposure times, result in reconstruction artifacts. Here, we demonstrate deep-learning based SR-SIM image denoising that results in high quality reconstructed images. A residual encoding-decoding convolution neural network (RED-Net) was used to successfully denoise computationally reconstructed noisy SR-SIM images. We also demonstrate the entirely deep-learning based denoising and reconstruction of raw SIM images into high-resolution SR-SIM images. Both image reconstruction methods prove to be very robust against image reconstruction artifacts and generalize very well over various noise levels. The combination of computational reconstruction and subsequent denoising via RED-Net shows very robust performance during inference after training even if the microscope settings change.


Author(s):  
Linyu Xu ◽  
Yanwei Zhang ◽  
Song Lang ◽  
Hongwei Wang ◽  
Huijie Hu ◽  
...  

Structured illumination microscopy (SIM) is a rapidly developing super-resolution technology. It has been widely used in various application fields of biomedicine due to its excellent two- and three-dimensional imaging capabilities. Furthermore, faster three-dimensional imaging methods are required to help enable more research-oriented living cell imaging. In this paper, a fast and sensitive three-dimensional structured illumination microscopy based on asymmetric three-beam interference is proposed. An innovative time-series acquisition method is employed to halve the time required to obtain each raw image. A segmented half-wave plate as a substantial linear polarization modulation method is applied to the three-dimensional SIM system for the first time. Although it needs to acquire 21 raw images instead of 15 to reconstruct one super-resolution image, the SIM setup proposed in this paper is 30% faster than the traditional spatial light modulator-SIM (SLM-SIM) in imaging each super-resolution image. The related theoretical derivation, hardware system, and verification experiment are elaborated in this paper. The stable and fast 3D super-resolution imaging method proposed in this paper is of great significance to the research of organelle interaction, intercellular communication, and other biomedical fields.


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