Investigation of atomic processes of multiple charged ions for their application to the EUV source

2021 ◽  
Author(s):  
Akira Sasaki
Keyword(s):  
Atomic Processes ◽  
Charged Ions

scholarly journals Modeling of Atomic Processes of Multiple Charged Ions in Plasmas and Its Application to the Study of EUV Light Sources

2011 ◽  
Vol 6 ◽  
pp. 2401145-2401145
Author(s):  
Akira SASAKI ◽  
Katsunobu NISHIHARA ◽  
Atsushi SUNAHARA ◽  
Hiroyuki FURUKAWA ◽  
Takeshi NISHIKAWA ◽  
...  
Keyword(s):  
Light Sources ◽  
Atomic Processes ◽  
Charged Ions

scholarly journals The influence of photo-induced processes and charge transfer on carbon and oxygen in the lower solar atmosphere

2021 ◽  
Author(s):  
R P Dufresne ◽  
G Del Zanna ◽  
N R Badnell
Keyword(s):  
Charge Transfer ◽  
Solar Atmosphere ◽  
Line Emission ◽  
Charge State Distribution ◽  
Lower Atmosphere ◽  
Atomic Processes ◽  
Solar Transition ◽  
Doubly Charged Ions ◽  
Ion Collisions ◽  
Charged Ions

Abstract To predict line emission in the solar atmosphere requires models which are fundamentally different depending on whether the emission is from the chromosphere or the corona. At some point between the two regions, there must be a change between the two modelling regimes. Recent extensions to the coronal modelling for carbon and oxygen lines in the solar transition region have shown improvements in the emission of singly- and doubly-charged ions, along with Li-like ions. However, discrepancies still remain, particularly for singly-charged ions and intercombination lines. The aim of this work is to explore additional atomic processes that could further alter the charge state distribution and the level populations within ions, in order to resolve some of the discrepancies. To this end, excitation and ionisation caused by both the radiation field and by atom-ion collisions have been included, along with recombination through charge transfer. The modelling is carried out using conditions which would be present in the quiet Sun, which allows an assessment of the part atomic processes play in changing coronal modelling, separately from dynamic and transient events taking place in the plasma. The effect the processes have on the fractional ion populations are presented, as well as the change in level populations brought about by the new excitation mechanisms. Contribution functions of selected lines from low charge states are also shown, to demonstrate the extent to which line emission in the lower atmosphere could be affected by the new modelling.

scholarly journals Stark widths of astrophysically important four- and five-times charged ion lines

1994 ◽  
Vol 162 ◽  
pp. 335-336
Author(s):  
Milan S. Dimitrijević
Keyword(s):  
Spectral Line ◽  
High Temperatures ◽  
Energy Transport ◽  
Spectral Lines ◽  
Stark Broadening ◽  
Atomic Processes ◽  
Multiply Charged ◽  
Extreme Uv ◽  
Stellar Interiors ◽  
Charged Ions

Important astrophysical applications of Stark broadening of spectral lines of multiply charged ions are in the physics of stellar interiors (Seaton 1987). In subphotospheric layers, the modelling of energy transport requires radiative opacities and thus, certain atomic processes must be known accurately. At these high temperatures (105 K or more) and densities (1017 − 1022 cm-3) Stark broadening of strong multicharged ionic lines plays a non-negligible role in the calculation of the opacities, especially in the UV. Moreover, with the development of spectroscopic investigations from space, UV and extreme UV spectral line research has been further stimulated.

In situ REM imaging of surface processes on ceramic bulk crystals from 300 to 1670 K in a conventional TEM

1991 ◽  
Vol 49 ◽  
pp. 660-661
Author(s):  
Z. L. Wang ◽  
J. Bentley
Keyword(s):  
High Temperatures ◽  
Image Resolution ◽  
Atomic Processes ◽  
Crystal Surfaces ◽  
Beam Radiation ◽  
Surface Areas ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Gas Reactions

Studying the behavior of surfaces at high temperatures is of great importance for understanding the properties of ceramics and associated surface-gas reactions. Atomic processes occurring on bulk crystal surfaces at high temperatures can be recorded by reflection electron microscopy (REM) in a conventional transmission electron microscope (TEM) with relatively high resolution, because REM is especially sensitive to atomic-height steps.Improved REM image resolution with a FEG: Cleaved surfaces of a-alumina (012) exhibit atomic flatness with steps of height about 5 Å, determined by reference to a screw (or near screw) dislocation with a presumed Burgers vector of b = (1/3)<012> (see Fig. 1). Steps of heights less than about 0.8 Å can be clearly resolved only with a field emission gun (FEG) (Fig. 2). The small steps are formed by the surface oscillating between the closely packed O and Al stacking layers. The bands of dark contrast (Fig. 2b) are the result of beam radiation damage to surface areas initially terminated with O ions.

Field ion microscope investigations of atomic processes at surfaces

1989 ◽  
Vol 47 ◽  
pp. 228-229
Author(s):  
G. L. Kellogg ◽  
P. R. Schwoebel
Keyword(s):  
Single Crystal ◽  
Crystal Surface ◽  
Linear Chain ◽  
Atom Probe ◽  
Nucleation And Growth ◽  
Single Atom ◽  
Initial Structure ◽  
Atomic Processes ◽  
Single Crystal Surfaces ◽  
Field Ion Microscope

Although no longer unique in its ability to resolve individual single atoms on surfaces, the field ion microscope remains a powerful tool for the quantitative characterization of atomic processes on single-crystal surfaces. Investigations of single-atom surface diffusion, adatom-adatom interactions, surface reconstructions, cluster nucleation and growth, and a variety of surface chemical reactions have provided new insights to the atomic nature of surfaces. Moreover, the ability to determine the chemical identity of selected atoms seen in the field ion microscope image by atom-probe mass spectroscopy has increased or even changed our understanding of solid-state-reaction processes such as ordering, clustering, precipitation and segregation in alloys. This presentation focuses on the operational principles of the field-ion microscope and atom-probe mass spectrometer and some very recent applications of the field ion microscope to the nucleation and growth of metal clusters on metal surfaces.The structure assumed by clusters of atoms on a single-crystal surface yields fundamental information on the adatom-adatom interactions important in crystal growth. It was discovered in previous investigations with the field ion microscope that, contrary to intuition, the initial structure of clusters of Pt, Pd, Ir and Ni atoms on W(110) is a linear chain oriented in the <111> direction of the substrate.

REACTIONS OF DOUBLY CHARGED IONS WITH VARIOUS NEUTRALS

1979 ◽  
Vol 40 (C7) ◽  
pp. C7-21-C7-22
Author(s):  
K. Peska ◽  
E. Alge ◽  
H. Villinger ◽  
H. Störi ◽  
W. Lindinger
Keyword(s):  
Doubly Charged Ions ◽  
Doubly Charged ◽  
Charged Ions

THE SPUTTERING OF NON-METALS UNDER SLOW MULTIPLY CHARGED IONS

1989 ◽  
Vol 50 (C2) ◽  
pp. C2-227-C2-230 ◽  
Author(s):  
I. S. BITENSKY ◽  
E. S. PARILIS
Keyword(s):  
Multiply Charged Ions ◽  
Multiply Charged ◽  
Charged Ions
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