Reflective receiver protectors with non-Hermitian CT-symmetric spectral protection of nonlinear defect modes

Author(s):  
Tsampikos Kottos ◽  
Ulrich Kuhl ◽  
Fabrice Mortessagne ◽  
Do Hyeok Jeon ◽  
Mattis Reisner ◽  
...  
Keyword(s):  
2018 ◽  
Author(s):  
Ke-Ying Lin ◽  
Chih-Yi Tang ◽  
Yu Chi Wang

Abstract The paper demonstrates the moving of lock-in thermography (LIT) spot location by adjusting the lock-in frequency from low to high. Accurate defect localization in stacked-die devices was decided by the fixed LIT spot location after the lock-in frequency was higher than a specific value depending on the depth of the defect in the IC. Physical failure analysis was performed based on LIT results, which provided clear physical defect modes of the stacked-die devices.


2013 ◽  
Author(s):  
Roman Verba ◽  
Vasil Tiberkevich ◽  
Elena Bankowski ◽  
Thomas Meitzler ◽  
Gennadiy Melkov ◽  
...  

Wave Motion ◽  
2021 ◽  
pp. 102766
Author(s):  
Joshua-Masinde Kundu ◽  
Ting Liu ◽  
Jia Tao ◽  
Bo-Yang Ma ◽  
Jia-Yi Zhang ◽  
...  

2020 ◽  
Vol 102 (22) ◽  
Author(s):  
M. Baraclough ◽  
I. R. Hooper ◽  
W. L. Barnes

2002 ◽  
Vol 112 (4) ◽  
pp. 1353-1358 ◽  
Author(s):  
J. N. Munday ◽  
C. Brad Bennett ◽  
W. M. Robertson
Keyword(s):  

2015 ◽  
Vol 47 (5) ◽  
pp. 3832-3883 ◽  
Author(s):  
V. Duchêne ◽  
I. Vukićević ◽  
M. I. Weinstein

1999 ◽  
Vol 60 (6) ◽  
pp. 6852-6854 ◽  
Author(s):  
Young-Chol Yang ◽  
Chul-Sik Kee ◽  
Jae-Eun Kim ◽  
Hae Yong Park ◽  
Jong-Cheon Lee ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document