X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source

2020 ◽  
Author(s):  
Zhao Shuai ◽  
Keyi Wang ◽  
Guangyu Cheng ◽  
Yuan Shen ◽  
Yushan Wang ◽  
...  
Keyword(s):  
X Ray ◽  
Laboratory Source

scholarly journals Imaging by 2D parabolic diamond X-ray compound refractive lens at the laboratory source

2016 ◽  
Author(s):  
S. I. Zholudev ◽  
S. A. Terentiev ◽  
S. N. Polyakov ◽  
S. Yu. Martyushov ◽  
V. N. Denisov ◽  
...  
Keyword(s):  
X Ray ◽  
Refractive Lens ◽  
Laboratory Source

Speckle-based x-ray phase-contrast imaging with a laboratory source and the scanning technique

2015 ◽  
Vol 40 (12) ◽  
pp. 2822 ◽  
Author(s):  
Tunhe Zhou ◽  
Irene Zanette ◽  
Marie-Christine Zdora ◽  
Ulf Lundström ◽  
Daniel H. Larsson ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Contrast Imaging ◽  
X Ray ◽  
Scanning Technique ◽  
Laboratory Source

STRUCTURAL DETERMINATION OF THE Si/Cu(110) INTERFACE BY PHOTOELECTRON DIFFRACTION

1997 ◽  
Vol 04 (06) ◽  
pp. 1331-1335 ◽  
Author(s):  
C. ROJAS ◽  
J. A. MARTÍn-GAGO ◽  
E. ROMÁN ◽  
G. PAOLUCCI ◽  
B. BRENA ◽  
...  
Keyword(s):  
Room Temperature ◽  
Structural Parameters ◽  
Single Scattering ◽  
Structural Determination ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
First Order ◽  
Proposed Model ◽  
Laboratory Source

Deposition of 0.5 Si monolayer (ML) on a Cu (110) surface at room temperature (RT) leads to the formation of a c(2×2) LEED pattern. In order to find out the surface atomic structure of this ordered phase, X-ray photoelectron diffraction (XPD) azimuthal scans at different photon energies and full hemispherical XPD patterns of the Si 2 p core level have been measured using both synchrotron radiation and a laboratory source. We present an atomic model for the surface structure based on the examination of forward scattering and first order interference XPD features. Refinement of the structural parameters was achieved by performing single scattering cluster (SSC) calculations. In the proposed model Si atoms replace Cu atoms at the surface along the [Formula: see text] atomic rows.

Phase contrast X-ray imaging of large samples using an incoherent laboratory source

2007 ◽  
Vol 204 (8) ◽  
pp. 2728-2733 ◽  
Author(s):  
C. Kottler ◽  
F. Pfeiffer ◽  
O. Bunk ◽  
C. Grünzweig ◽  
J. Bruder ◽  
...  
Keyword(s):  
Phase Contrast ◽  
X Ray ◽  
Large Samples ◽  
X Ray Imaging ◽  
Laboratory Source

scholarly journals X-ray ghost imaging with a laboratory source

2017 ◽  
Vol 25 (13) ◽  
pp. 14822 ◽  
Author(s):  
A. Schori ◽  
S. Shwartz
Keyword(s):  
Ghost Imaging ◽  
X Ray ◽  
Laboratory Source

Effect of pressure on crystalline L- and DL-serine: revisited by a combined single-crystal X-ray diffraction at a laboratory source and polarized Raman spectroscopy study

2012 ◽  
Vol 68 (3) ◽  
pp. 275-286 ◽  
Author(s):  
Boris A. Zakharov ◽  
Boris A. Kolesov ◽  
Elena V. Boldyreva
Keyword(s):  
Raman Spectroscopy ◽  
Hydrogen Bonds ◽  
Single Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Effect Of Pressure ◽  
Laboratory Source ◽  
Compression Mechanism ◽  
Polarized Raman Spectroscopy ◽  
Polarized Raman

Information on the effect of pressure on hydrogen bonds, which could be derived from single-crystal X-ray diffraction at a laboratory source and polarized Raman spectroscopy, has been compared. L-Serine and DL-serine were selected for this case study. The role of hydrogen bonds in pressure-induced phase transitions in the first system and in the structural stability of the second one are discussed. Non-monotonic distortion of selected hydrogen bonds in the pressure range below ∼ 1–2 GPa, a change in the compression mechanism at ∼ 2–3 GPa, and the evidence of formation of bifurcated N—H...O hydrogen bonds in DL-serine at ∼ 3–4 GPa are considered.

A study of X-ray multiple diffraction by means of section topography

2015 ◽  
Vol 71 (5) ◽  
pp. 519-525 ◽  
Author(s):  
V. G. Kohn ◽  
I. A. Smirnova
Keyword(s):  
Computer Simulations ◽  
Azimuthal Angle ◽  
Silicon Single Crystal ◽  
Multiple Diffraction ◽  
X Ray ◽  
Interference Fringes ◽  
Laboratory Source ◽  
Diffraction Region ◽  
First Time ◽  
Section Topography

The results of theoretical and experimental study are presented for the question of how the X-ray multiple diffraction in a silicon single crystal influences the interference fringes of section topography for the 400 reflection in the Laue case. Two different cases of multiple diffraction are discovered for zero and very small values of the azimuthal angle for the sample in the form of a plate with the surface normal to the 001 direction. The cases are seen on the same topogram without rotation of the crystal. Accurate computer simulations of the section topogram for the case of X-ray multiple diffraction are performed for the first time. It is shown that the structure of interference fringes on the section topogram in the region of multiple diffraction becomes more complicated. It has a very sharp dependence on the azimuthal angle. The experiment is carried out using a laboratory source under conditions of low resolution over the azimuthal angle. Nevertheless, the characteristic inclination of the interference fringes on the tails of the multiple diffraction region is easily seen. This phenomenon corresponds completely to the computer simulations.

Evaluation of chemical speciation on Lp (p = l, α, η, β) X-ray emission peaks of thallium compounds with a wavelength-dispersive spectrometer

2020 ◽  
Vol 35 (12) ◽  
pp. 2935-2947
Author(s):  
Harpreet Singh Kainth ◽  
Deeksha Khandelwal
Keyword(s):  
Chemical Speciation ◽  
Emission Lines ◽  
X Ray ◽  
Laboratory Source ◽  
Wavelength Dispersive Spectrometer ◽  
Thallium Compounds

The measurements of X-ray emission lines in atomic decay to the L-shell of thallium compounds were performed using a laboratory source-based conventional wavelength dispersive spectrometer.

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