X-ray diffraction in strongly bent crystals used as a spectrometer for X-ray Free-Electron Laser (XFEL) pulses

2020 ◽  
Author(s):  
Vladimir Kaganer ◽  
Ilia Petrov ◽  
Anders Madsen ◽  
Liubov Samoylova
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bent Crystals

scholarly journals X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses

2020 ◽  
Vol 76 (1) ◽  
pp. 55-69 ◽  
Author(s):  
Vladimir M. Kaganer ◽  
Ilia Petrov ◽  
Liubov Samoylova
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Laser Pulses ◽  
Crystal Thickness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bending Radius ◽  
Extinction Length ◽  
Bent Crystals ◽  
Better Than

The use of strongly bent crystals in spectrometers for pulses of a hard X-ray free-electron laser is explored theoretically. Diffraction is calculated in both dynamical and kinematical theories. It is shown that diffraction can be treated kinematically when the bending radius is small compared with the critical radius given by the ratio of the Bragg-case extinction length for the actual reflection to the Darwin width of this reflection. As a result, the spectral resolution is limited by the crystal thickness, rather than the extinction length, and can become better than the resolution of a planar dynamically diffracting crystal. As an example, it is demonstrated that spectra of the 12 keV pulses can be resolved in the 440 reflection from a 20 µm-thick diamond crystal bent to a radius of 10 cm.

scholarly journals X-Ray Diffraction from Isolated and Strongly Aligned Gas-Phase Molecules with a Free-Electron Laser

2014 ◽  
Vol 112 (8) ◽  
Author(s):  
Jochen Küpper ◽  
Stephan Stern ◽  
Lotte Holmegaard ◽  
Frank Filsinger ◽  
Arnaud Rouzée ◽  
...  
Keyword(s):  
Gas Phase ◽  
Free Electron ◽  
Free Electron Laser ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gas Phase Molecules

scholarly journals Data processing software suiteSITENNOfor coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

2014 ◽  
Vol 21 (3) ◽  
pp. 600-612 ◽  
Author(s):  
Yuki Sekiguchi ◽  
Tomotaka Oroguchi ◽  
Yuki Takayama ◽  
Masayoshi Nakasako
Keyword(s):  
Data Processing ◽  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Custom Made ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Ccd Detectors

Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the `diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite namedSITENNOhas been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using theSITENNOsuite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles.

scholarly journals Specimen preparation for cryogenic coherent X-ray diffraction imaging of biological cells and cellular organelles by using the X-ray free-electron laser at SACLA

2016 ◽  
Vol 23 (4) ◽  
pp. 975-989 ◽  
Author(s):  
Amane Kobayashi ◽  
Yuki Sekiguchi ◽  
Tomotaka Oroguchi ◽  
Koji Okajima ◽  
Asahi Fukuda ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
X Ray Diffraction ◽  
X Ray ◽  
Internal Structures ◽  
Thin Membranes ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Cellular Organelles

Coherent X-ray diffraction imaging (CXDI) allows internal structures of biological cells and cellular organelles to be analyzed. CXDI experiments have been conducted at 66 K for frozen-hydrated biological specimens at the SPring-8 Angstrom Compact Free-Electron Laser facility (SACLA). In these cryogenic CXDI experiments using X-ray free-electron laser (XFEL) pulses, specimen particles dispersed on thin membranes of specimen disks are transferred into the vacuum chamber of a diffraction apparatus. Because focused single XFEL pulses destroy specimen particles at the atomic level, diffraction patterns are collected through raster scanning the specimen disks to provide fresh specimen particles in the irradiation area. The efficiency of diffraction data collection in cryogenic experiments depends on the quality of the prepared specimens. Here, detailed procedures for preparing frozen-hydrated biological specimens, particularly thin membranes and devices developed in our laboratory, are reported. In addition, the quality of the frozen-hydrated specimens are evaluated by analyzing the characteristics of the collected diffraction patterns. Based on the experimental results, the internal structures of the frozen-hydrated specimens and the future development for efficient diffraction data collection are discussed.

scholarly journals Femtosecond free-electron laser x-ray diffraction data sets for algorithm development

2012 ◽  
Vol 20 (4) ◽  
pp. 4149 ◽  
Author(s):  
Stephan Kassemeyer ◽  
Jan Steinbrener ◽  
Lukas Lomb ◽  
Elisabeth Hartmann ◽  
Andrew Aquila ◽  
...  
Keyword(s):  
Diffraction Data ◽  
Free Electron ◽  
Free Electron Laser ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Algorithm Development ◽  
X Ray
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