Determination of secondary electron attenuation length to characterize electron blur (Conference Presentation)

2020 ◽  
Author(s):  
Oleg Kostko ◽  
Jonathan H. Ma ◽  
Patrick Naulleau
Keyword(s):  
Secondary Electron ◽  
Attenuation Length

Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer

2016 ◽  
Vol 49 (5) ◽  
pp. 464-468
Author(s):  
Paul M. Dietrich ◽  
Dieter Treu ◽  
Henryk Kalbe ◽  
Michael Krumrey ◽  
Thomas Gross ◽  
...  
Keyword(s):  
Experimental Determination ◽  
Attenuation Length

Assessment of Photovoltaic Junction Position in CdTe Solar Cells Using a Combined FIB-EBIC Technique

2012 ◽  
Vol 1432 ◽  
Author(s):  
Jonathan D. Major ◽  
Leon Bowen ◽  
Robert E. Treharne ◽  
Ken Durose
Keyword(s):  
Solar Cells ◽  
Secondary Electron ◽  
Ion Beam ◽  
Rf Sputtering ◽  
Cdte Solar Cells ◽  
Close Space Sublimation ◽  
Focussed Ion Beam ◽  
Electron Beam Induced Current ◽  
Space Sublimation

ABSTRACTTwo issues relating to the determination of junction position in thin film CdTe solar cells have been investigated. Firstly, the use of a focussed ion beam (FIB) milling as a method of sample preparation for electron beam induced current (EBIC) analysis is demonstrated. It is superior to fracturing methods. High quality secondary electron and combined secondary electron/EBIC images are presented and interpreted for solar cells with CdTe layers deposited by both close space sublimation (CSS) or RF sputtering. Secondly, it was shown that in an RF-sputtered CdTe device, while the photovoltaic junction was buried ~1.1 μm from the metallurgical interface, the shape of the external quantum efficiency (EQE) curve did not indicate the presence of a buried homo-junction. SCAPS modelling was used to verify that EQE curve shapes are not sensitive to junctions buried < 1.5μm from the CdTe/CdS interface.

scholarly journals High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy

2011 ◽  
Vol 110 (1) ◽  
pp. 014315 ◽  
Author(s):  
Vidya Kochat ◽  
Atindra Nath Pal ◽  
E. S. Sneha ◽  
Arjun Sampathkumar ◽  
Anshita Gairola ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Secondary Electron ◽  
High Contrast ◽  
Contrast Imaging ◽  
Thickness Determination ◽  
High Contrast Imaging

Determination of secondary electron yield from insulators due to a low-kV electron beam

1998 ◽  
Vol 84 (8) ◽  
pp. 4543-4548 ◽  
Author(s):  
Y. C. Yong ◽  
J. T. L. Thong ◽  
J. C. H. Phang
Keyword(s):  
Electron Beam ◽  
Secondary Electron ◽  
Secondary Electron Yield ◽  
Electron Yield

Determination of secondary electron ejection coefficients for rare gas metastable atoms

1975 ◽  
Vol 46 (6) ◽  
pp. 697-701 ◽  
Author(s):  
F. B. Dunning ◽  
R. D. Rundel ◽  
R. F. Stebbings
Keyword(s):  
Secondary Electron ◽  
Rare Gas ◽  
Electron Ejection
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