Determination of secondary electron ejection coefficients for rare gas metastable atoms

1975 ◽  
Vol 46 (6) ◽  
pp. 697-701 ◽  
Author(s):  
F. B. Dunning ◽  
R. D. Rundel ◽  
R. F. Stebbings
2012 ◽  
Vol 1432 ◽  
Author(s):  
Jonathan D. Major ◽  
Leon Bowen ◽  
Robert E. Treharne ◽  
Ken Durose

ABSTRACTTwo issues relating to the determination of junction position in thin film CdTe solar cells have been investigated. Firstly, the use of a focussed ion beam (FIB) milling as a method of sample preparation for electron beam induced current (EBIC) analysis is demonstrated. It is superior to fracturing methods. High quality secondary electron and combined secondary electron/EBIC images are presented and interpreted for solar cells with CdTe layers deposited by both close space sublimation (CSS) or RF sputtering. Secondly, it was shown that in an RF-sputtered CdTe device, while the photovoltaic junction was buried ~1.1 μm from the metallurgical interface, the shape of the external quantum efficiency (EQE) curve did not indicate the presence of a buried homo-junction. SCAPS modelling was used to verify that EQE curve shapes are not sensitive to junctions buried < 1.5μm from the CdTe/CdS interface.


2011 ◽  
Vol 110 (1) ◽  
pp. 014315 ◽  
Author(s):  
Vidya Kochat ◽  
Atindra Nath Pal ◽  
E. S. Sneha ◽  
Arjun Sampathkumar ◽  
Anshita Gairola ◽  
...  

1969 ◽  
Vol 50 (4) ◽  
pp. 1779-1787 ◽  
Author(s):  
T. A. Delchar ◽  
D. A. MacLennan ◽  
A. M. Landers
Keyword(s):  
Rare Gas ◽  

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