Simple approach to refractive index measurements of polystyrene microspheres (Conference Presentation)

2020 ◽  
Author(s):  
Peter Naglic ◽  
Yevhen Zelinskyi ◽  
Boštjan Likar ◽  
Miran Bürmen
Keyword(s):  
Refractive Index ◽  
Simple Approach ◽  
Polystyrene Microspheres

Determination of complex refractive index of polystyrene microspheres from 370 to 1610 nm

2003 ◽  
Vol 48 (24) ◽  
pp. 4165-4172 ◽  
Author(s):  
Xiaoyan Ma ◽  
Jun Q Lu ◽  
R Scott Brock ◽  
Kenneth M Jacobs ◽  
Ping Yang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Polystyrene Microspheres

scholarly journals Fabrication and Optical Property of PeriodicSn1-xTixO2Nanostructures Patterned by the Polystyrene Microsphere Templates

2011 ◽  
Vol 2011 ◽  
pp. 1-7
Author(s):  
Shutian Chen ◽  
Zhengcao Li ◽  
Zhengjun Zhang
Keyword(s):  
Refractive Index ◽  
Optical Property ◽  
Sputter Deposition ◽  
Polystyrene Microspheres ◽  
Polystyrene Microsphere ◽  
Sphere Size ◽  
Sputtering Power ◽  
Glancing Angle ◽  
Anisotropic Morphology ◽  
Regular Arrays

Regular arrays ofSn1-xTixO2nanostructures were fabricated by glancing angle sputter deposition onto self-assembled close-packed arrays of 200 nm diameter, 500 nm diameter, and 1 μm diameter polystyrene microspheres, respectively. The morphology of the nanostructures could be modulated by the variation of the sputtering power of Ti target and the size of polystyrene microspheres templates. Accordingly, the performance of reflection which was dependent on the morphology of nanostructures could be tuned by optimizing the parameters. The anisotropic morphology of nanoflakes achieved by adjusting the sputtering power of Ti target could generate the anisotropism of reflectance. With the increase of the PS sphere size, the anisotropism of nanostructures weakened; however, they exhibited excellent antireflection effects by creating a smaller gradient of refractive index.

Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

1977 ◽  
Vol 35 ◽  
pp. 328-329
Author(s):  
E. A. Kenik ◽  
J. Bentley
Keyword(s):  
Thin Foil ◽  
Electron Excitation ◽  
Simple Approach ◽  
Foil Thickness ◽  
X Rays ◽  
X Ray ◽  
Hole Spectrum ◽  
Illumination System ◽  
Thin Foils ◽  
Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

TEM characterization of proton-exchanged LiNbO3 optical waveguides

1986 ◽  
Vol 44 ◽  
pp. 480-481
Author(s):  
W. E. Lee
Keyword(s):  
Refractive Index ◽  
Benzoic Acid ◽  
Optical Waveguides ◽  
Total Internal Reflection ◽  
Index Of Refraction ◽  
Optical Measurements ◽  
Lithium Ions ◽  
Wide Channel ◽  
Tem Characterization

An optical waveguide consists of a several-micron wide channel with a slightly different index of refraction than the host substrate; light can be trapped in the channel by total internal reflection.Optical waveguides can be formed from single-crystal LiNbO3 using the proton exhange technique. In this technique, polished specimens are masked with polycrystal1ine chromium in such a way as to leave 3-13 μm wide channels. These are held in benzoic acid at 249°C for 5 minutes allowing protons to exchange for lithium ions within the channels causing an increase in the refractive index of the channel and creating the waveguide. Unfortunately, optical measurements often reveal a loss in waveguiding ability up to several weeks after exchange.

Light microscopy of ceramics

1993 ◽  
Vol 51 ◽  
pp. 908-909
Author(s):  
Walter C. McCrone
Keyword(s):  
Refractive Index ◽  
Light Microscopy ◽  
Light Microscope ◽  
Polarized Light ◽  
Refractive Indices ◽  
Complete Coverage ◽  
The Subject ◽  
Lower Refractive Index

An excellent chapter on this subject by V.D. Fréchette appeared in a book edited by L.L. Hench and R.W. Gould in 1971 (1). That chapter with the references cited there provides a very complete coverage of the subject. I will add a more complete coverage of an important polarized light microscope (PLM) technique developed more recently (2). Dispersion staining is based on refractive index and its variation with wavelength (dispersion of index). A particle of, say almandite, a garnet, has refractive indices of nF = 1.789 nm, nD = 1.780 nm and nC = 1.775 nm. A Cargille refractive index liquid having nD = 1.780 nm will have nF = 1.810 and nC = 1.768 nm. Almandite grains will disappear in that liquid when observed with a beam of 589 nm light (D-line), but it will have a lower refractive index than that liquid with 486 nm light (F-line), and a higher index than that liquid with 656 nm light (C-line).

Sign in / Sign up

Export Citation Format

Share Document