Charge trapping and degradation of Ga2O3 isolation structures for power electronics

2020 ◽  
Author(s):  
Carlo De Santi ◽  
Arianna Nardo ◽  
Man Hoi Wong ◽  
Ken Goto ◽  
Akito Kuramata ◽  
...  
Keyword(s):  
Power Electronics ◽  
Charge Trapping

Charge Trapping and Degradation Properties of PZT Thin Films for MEMS

1996 ◽  
Vol 444 ◽  
Author(s):  
Hyeon-Seag Kim ◽  
D. L. Polla ◽  
S. A. Campbell
Keyword(s):  
Thin Films ◽  
Loss Factor ◽  
High Field ◽  
Microelectromechanical Systems ◽  
Charge Trapping ◽  
Metal Organic ◽  
Electrical Reliability ◽  
Silicon Based ◽  
Degradation Properties ◽  
Organic Decomposition

AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).

JET IMPINGEMENT-COOLED MODULE FOR AUTOMOTIVE POWER ELECTRONICS USING WATER-ETHYLENE GLYCOL

2017 ◽  
Author(s):  
Michael A. Henry ◽  
John F. Maddox ◽  
Sushil Bhavnani ◽  
Roy W. Knight ◽  
James Pool
Keyword(s):  
Ethylene Glycol ◽  
Power Electronics ◽  
Jet Impingement
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