Advances in in-situ metrology during epitaxy of UV-LEDs and related optical devices (Conference Presentation)

2020 ◽  
Author(s):  
Kolja Haberland
Keyword(s):  
Optical Devices ◽  
In Situ Metrology ◽  
Uv Leds

scholarly journals Advanced in situ metrology for x-ray beam shaping with super precision

2015 ◽  
Vol 23 (2) ◽  
pp. 1605 ◽  
Author(s):  
Hongchang Wang ◽  
John Sutter ◽  
Kawal Sawhney
Keyword(s):  
Beam Shaping ◽  
X Ray ◽  
In Situ Metrology

In Situ Metrology

2001 ◽  
Author(s):  
Bradley Van Eck ◽  
Jimmy Barna ◽  
Gabriel Hosch
Keyword(s):  
In Situ Metrology

In-situ metrology and testing of nanotwinned copper pillars for potential air gap applications

2010 ◽  
Vol 87 (11) ◽  
pp. 2046-2049 ◽  
Author(s):  
Vinay Sriram ◽  
Jenn-Ming Yang ◽  
Jia Ye ◽  
Andrew M. Minor
Keyword(s):  
Air Gap ◽  
In Situ Metrology

In-situ metrology for adaptive x-ray optics with an in-position LTP system in the soft x-ray beamline

2020 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Chih-Yu Hua ◽  
Hok-Sum Fung ◽  
Ming-Ying Hsu ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
In Situ Metrology

scholarly journals Sinking Organic Particles in the Ocean—Flux Estimates From in situ Optical Devices

2020 ◽  
Vol 6 ◽  
Author(s):  
Sarah Lou Carolin Giering ◽  
Emma Louise Cavan ◽  
Sünnje Linnéa Basedow ◽  
Nathan Briggs ◽  
Adrian B. Burd ◽  
...  
Keyword(s):  
Optical Devices ◽  
Organic Particles

In situ metrology of 85Kr plumes released by the COGEMA La Hague nuclear reprocessing plant

2004 ◽  
Vol 72 (1-2) ◽  
pp. 137-144 ◽  
Author(s):  
R Gurriaran ◽  
D Maro ◽  
P Bouisset ◽  
D Hebert ◽  
G Leclerc ◽  
...  
Keyword(s):  
Nuclear Reprocessing ◽  
In Situ Metrology ◽  
Reprocessing Plant
Sign in / Sign up

Export Citation Format

Share Document