Laser and electrochemical hybrid machining (LECM) based on internal total reflection effect

2019 ◽  
Author(s):  
Yufeng Wang ◽  
Feng Yang ◽  
Wenwu Zhang
Keyword(s):  
Total Reflection ◽  
Reflection Effect ◽  
Hybrid Machining

Simulation of Electronic Total-Reflection Effect in a Graphene Junction

2014 ◽  
Vol 61 (3) ◽  
pp. 391-396 ◽  
Author(s):  
Wei-Wei Tao ◽  
Bo Liu ◽  
Qian Dai ◽  
Sa-Ke Wang
Keyword(s):  
Total Reflection ◽  
Reflection Effect

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Determination of some heavy metals (Fe, Cu, Zn and Pb) in blood by total reflection X-ray fluorescence

2003 ◽  
Vol 107 ◽  
pp. 203-206 ◽  
Author(s):  
M. Bounakhla ◽  
A. Doukkali ◽  
K. Lalaoui ◽  
H. Aguenaou ◽  
N. Mokhtar ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Total Reflection ◽  
X Ray

On birefringence phenomena, associated with total reflection

1973 ◽  
Vol 34 (5-6) ◽  
pp. 335-340 ◽  
Author(s):  
B. Julia ◽  
A. Neveu
Keyword(s):  
Total Reflection
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