Global optimization of two-multilayer mirror objective for focusing soft X-ray high harmonics

Author(s):  
Mitsunori Toyoda ◽  
Shota Yamashita ◽  
Jun Chen
2020 ◽  
Author(s):  
Kiranjot ◽  
Mangalika Sinha ◽  
R. K. Gupta ◽  
P. K. Yadav ◽  
Mohammed H. Modi

2004 ◽  
Vol 75 (10) ◽  
pp. 4029-4032 ◽  
Author(s):  
B. Jones ◽  
C. Deeney ◽  
A. Pirela ◽  
C. Meyer ◽  
D. Petmecky ◽  
...  
Keyword(s):  
X Ray ◽  

2001 ◽  
Vol 72 (1) ◽  
pp. 1183-1187 ◽  
Author(s):  
S. Duorah ◽  
A. Ejiri ◽  
S. Lee ◽  
H. Iguchi ◽  
A. Fujisawa ◽  
...  

1989 ◽  
Vol 22 (4) ◽  
pp. 363-371 ◽  
Author(s):  
R. Somashekar ◽  
I. H. Hall ◽  
P. D. Carr

Methods which determine the number and disorder of lattice planes in a crystal from the Fourier cosine coefficients of the intensity profile of an X-ray reflection use only the low harmonics and require that the coefficients be normalized so that the zero harmonic is unity. Experimentally, the profiles can only be recorded over a smaller range of scattering angle than required by the theory, and it is necessary to subtract background, which is likely to be estimated with considerable error, before determining the coefficients. It is shown that with polymer fibres this causes serious errors in the normalization, and in the values of those low harmonics used in the size and disorder determination, and prevents reliable values being obtained. Methods which avoid normalization and use only high harmonics are needed. It is shown that disorder may be obtained in such a way, but not size, for which low-order normalized coefficients are essential. A method of extrapolation is described and tested which enables the accurate high harmonics to be used to improve the estimates of the low ones. Whilst this will yield more reliable values of crystal size than are obtainable from existing methods, the accuracy depends entirely on the validity of the extrapolation, which cannot be tested in many cases of interest.


2005 ◽  
Vol 103 (2) ◽  
pp. 399-426
Author(s):  
Diane C. Jamrog ◽  
George N. Phillips Jr. ◽  
Richard A. Tapia ◽  
Yin Zhang

2021 ◽  
Vol 54 (6) ◽  
Author(s):  
Roman Pleshkov ◽  
Nikolay Chkhalo ◽  
Vladimir Polkovnikov ◽  
Mikhail Svechnikov ◽  
Maria Zorina

The structures of Cr/Be multilayer mirror interfaces are investigated using X-ray reflectometry, diffuse X-ray scattering and atomic force microscopy. The combination of these methods makes it possible to separate the contributions of roughness and interlayer diffusion/intermixing for each sample. In the range of period thicknesses of 2.26–0.8 nm, it is found that the growth roughness of the Cr/Be multilayer mirrors does not depend on the period thickness and is ∼0.2 nm. The separation of roughness and diffuseness allows estimation of layer material intermixing and the resulting drop in the optical contrast, which is from 0.85 to 0.17 in comparison with an ideally sharp structure.


2006 ◽  
Vol 77 (10) ◽  
pp. 10F330 ◽  
Author(s):  
D. Stutman ◽  
K. Tritz ◽  
L. Delgado-Aparicio ◽  
M. Finkenthal ◽  
G. Suliman ◽  
...  

2001 ◽  
Vol 206-213 ◽  
pp. 775-778 ◽  
Author(s):  
Gert Roebben ◽  
Chao Zhao ◽  
Ren-Guan Duan ◽  
Jef Vleugels ◽  
Marc M. Heyns ◽  
...  

2015 ◽  
Vol 22 (5) ◽  
pp. 1151-1154 ◽  
Author(s):  
Berit Marx-Glowna ◽  
Kai S. Schulze ◽  
Ingo Uschmann ◽  
Tino Kämpfer ◽  
Günter Weber ◽  
...  

The spectrum of the undulator radiation of beamline P01 at Petra III has been measured after passing a multiple reflection channel-cut polarimeter. Odd and even harmonics up to the 15th order, as well as Compton peaks which were produced by the high harmonics in the spectrum, could been measured. These additional contributions can have a tremendous influence on the performance of the polarimeter and have to be taken into account for further polarimeter designs.


2015 ◽  
Author(s):  
Tingting Fan ◽  
Patrik Gychtol ◽  
Ronny Knut ◽  
Carlos Hernández-García ◽  
Daniel Hickstein ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document