Theoretical count rate capabilities of polycrystalline silicon photon counting imagers for CBCT applications

2019 ◽  
Author(s):  
Albert K. Liang ◽  
Youcef El-Mohri ◽  
Qihua Zhao ◽  
Martin Koniczek ◽  
Larry E. Antonuk
Keyword(s):  
Count Rate ◽  
Polycrystalline Silicon ◽  
Photon Counting

Count rate capabilities of polycrystalline silicon photon counting detectors for CBCT applications—a theoretical study

2020 ◽  
Vol 65 (3) ◽  
pp. 035009
Author(s):  
Albert K Liang ◽  
Youcef El-Mohri ◽  
Qihua Zhao ◽  
Martin Koniczek ◽  
Larry E Antonuk
Keyword(s):  
Count Rate ◽  
Polycrystalline Silicon ◽  
Theoretical Study ◽  
Photon Counting ◽  
Photon Counting Detectors

TU-FG-209-03: Exploring the Maximum Count Rate Capabilities of Photon Counting Arrays Based On Polycrystalline Silicon

2016 ◽  
Vol 43 (6Part35) ◽  
pp. 3761-3761
Author(s):  
A K Liang ◽  
M Koniczek ◽  
L E Antonuk ◽  
Y El-Mohri ◽  
Q Zhao
Keyword(s):  
Count Rate ◽  
Polycrystalline Silicon ◽  
Photon Counting

scholarly journals Theoretical investigation of the count rate capabilities of in-pixel amplifiers for photon counting arrays based on polycrystalline silicon TFTs

2018 ◽  
Vol 45 (10) ◽  
pp. 4418-4429 ◽  
Author(s):  
Albert K. Liang ◽  
Martin Koniczek ◽  
Larry E. Antonuk ◽  
Youcef El-Mohri ◽  
Qihua Zhao
Keyword(s):  
Theoretical Investigation ◽  
Count Rate ◽  
Polycrystalline Silicon ◽  
Photon Counting

scholarly journals Design of a Real-Time Breakdown Voltage and On-Chip Temperature Monitoring System for Single Photon Avalanche Diodes

Electronics ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 25
Author(s):  
Shijie Deng ◽  
Alan P. Morrison ◽  
Yong Guo ◽  
Chuanxin Teng ◽  
Ming Chen ◽  
...  
Keyword(s):  
Real Time ◽  
Breakdown Voltage ◽  
Count Rate ◽  
Single Photon ◽  
Photon Counting ◽  
Temperature Monitoring ◽  
Dark Count ◽  
Chip Temperature ◽  
Avalanche Diodes ◽  
On Chip

The design and implementation of a real-time breakdown voltage and on-chip temperature monitoring system for single photon avalanche diodes (SPADs) is described in this work. In the system, an on-chip shaded (active area of the detector covered by a metal layer) SPAD is used to provide a dark count rate for the breakdown voltage and temperature calculation. A bias circuit was designed to provide a bias voltage scanning for the shaded SPAD. A microcontroller records the pulses from the anode of the shaded SPAD and calculates its real-time dark count rate. An algorithm was developed for the microcontroller to calculate the SPAD’s breakdown voltage and the on-chip temperature in real time. Experimental results show that the system is capable of measuring the SPAD’s breakdown voltage with a mismatch of less than 1.2%. Results also show that the system can provide real-time on-chip temperature monitoring for the range of −10 to 50 °C with errors of less than 1.7 °C. The system proposed can be used for the real-time SPAD’s breakdown voltage and temperature estimation for dual-SPADs or SPAD arrays chip where identical detectors are fabricated on the same chip and one or more dummy SPADs are shaded. With the breakdown voltage and the on-chip temperature monitoring, intelligent control logic can be developed to optimize the performance of the SPAD-based photon counting system by adjusting the parameters such as excess bias voltage and dead-time. This is particularly useful for SPAD photon counting systems used in complex working environments such as the applications in 3D LIDAR imaging for geodesy, geology, geomorphology, forestry, atmospheric physics and autonomous vehicles.

Scaling of dark count rate with active area in 1.06μm photon-counting InGaAsP∕InP avalanche photodiodes

2006 ◽  
Vol 89 (11) ◽  
pp. 111102 ◽  
Author(s):  
E. A. Dauler ◽  
P. I. Hopman ◽  
K. A. McIntosh ◽  
J. P. Donnelly ◽  
E. K. Duerr ◽  
...  
Keyword(s):  
Count Rate ◽  
Avalanche Photodiodes ◽  
Photon Counting ◽  
Active Area ◽  
Dark Count ◽  
Dark Count Rate

scholarly journals Multicolor spectral photon-counting computed tomography: in vivo dual contrast imaging with a high count rate scanner

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
David P. Cormode ◽  
Salim Si-Mohamed ◽  
Daniel Bar-Ness ◽  
Monica Sigovan ◽  
Pratap C. Naha ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Count Rate ◽  
Photon Counting ◽  
Contrast Imaging ◽  
High Count ◽  
High Count Rate

A count rate-dependent method for spectral distortion correction in photon counting CT

2018 ◽  
Author(s):  
Jannis Dickmann ◽  
Joscha Maier ◽  
Stefan Sawall ◽  
Marc Kachelriess ◽  
Christian Broennimann ◽  
...  
Keyword(s):  
Count Rate ◽  
Photon Counting ◽  
Distortion Correction ◽  
Spectral Distortion ◽  
Rate Dependent
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