Effect of electron scrubbing on gain and dynamic range of microchannel plate

2018 ◽  
Author(s):  
Jiao Lian ◽  
Yong Sun ◽  
Xian Zhang ◽  
Yuechong Feng ◽  
Tiezhu Bo ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Microchannel Plate

Extended dynamic range of ultra-high speed gated microchannel plate for x-ray framing camera

2009 ◽  
Author(s):  
Jingsheng Pan ◽  
Jingwen Lv ◽  
Zhurong Cao ◽  
Shenye Liu ◽  
Shulin Liu ◽  
...  
Keyword(s):  
High Speed ◽  
Dynamic Range ◽  
Microchannel Plate ◽  
X Ray ◽  
Ultra High Speed ◽  
Extended Dynamic ◽  
Framing Camera

scholarly journals Influence analysis of saturation effect of microchannel plate on dynamic range of streak cameras

2012 ◽  
Vol 61 (19) ◽  
pp. 194211
Author(s):  
Pan Jing-Sheng ◽  
Qi Lu ◽  
Xiao Hong-Liang ◽  
Zhang Rong ◽  
Zhou Jian-Xun ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Microchannel Plate ◽  
Saturation Effect ◽  
Influence Analysis

scholarly journals Extending the dynamic range of microchannel plate detectors using charge-integration-based counting

2018 ◽  
Vol 89 (7) ◽  
pp. 073301
Author(s):  
Daniel J. Gershman ◽  
Levon A. Avanov ◽  
Dennis J. Chornay ◽  
Amy C. Rager ◽  
Craig J. Pollock ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Microchannel Plate ◽  
Charge Integration

Distortion-Free Microchannel Plate Mercury Atomic Resonance Ionization Image Detector

2000 ◽  
Vol 54 (2) ◽  
pp. 175-180 ◽  
Author(s):  
A. A. Podshivalov ◽  
W. L. Clevenger ◽  
O. I. Matveev ◽  
B. W. Smith ◽  
J. D. Winefordner
Keyword(s):  
Spatial Resolution ◽  
Dynamic Range ◽  
Contrast Ratio ◽  
Photoelectric Effect ◽  
Microchannel Plate ◽  
Resonance Ionization ◽  
Image Detector ◽  
Charge Coupled Device ◽  
Signal Energy ◽  
Better Than

An atomic mercury resonance image detector with microchannel plate amplification and charge-coupled device (CCD) detection is evaluated. A thin Pt film on the surface of the input window of the resonance ionization image detector (RIID) eliminated the surface charge on the input window. Image spatial resolution of better than 120 μm was achieved. The linearity of the image intensity vs. imaging signal energy is currently limited by the linearity of the CCD. In addition, the image quality (spatial resolution and dynamic range) is improved by using a microchannel plate (MCP) in front of the input window of the RIID. The RIID has a much improved contrast ratio. Several noises, including multiphoton photoionization noise, noise due to parasitic luminescence of the phospher screen, and MCP noise, were minimized. The main noise source was the photoelectric effect of the metal input electrode of the CCD when illuminated by 254 nm radiation.

Microchannel Plate Imaging Detectors for High Dynamic Range Applications

2017 ◽  
Vol 64 (7) ◽  
pp. 1774-1780 ◽  
Author(s):  
C. D. Ertley ◽  
O. H. W. Siegmund ◽  
J. Hull ◽  
A. Tremsin ◽  
A. O'Mahony ◽  
...  
Keyword(s):  
Dynamic Range ◽  
High Dynamic Range ◽  
Microchannel Plate ◽  
Imaging Detectors ◽  
High Dynamic

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

Quantitative energy-filtered electron diffraction

1994 ◽  
Vol 52 ◽  
pp. 992-993
Author(s):  
R. Vincent
Keyword(s):  
Electron Diffraction ◽  
Inelastic Scattering ◽  
Dynamic Range ◽  
Electron Optics ◽  
Surface Layers ◽  
High Brightness ◽  
Inclined Surfaces ◽  
Perfect Symmetry ◽  
Amorphous Surface ◽  
The Ideal

Microanalysis and diffraction on a sub-nanometre scale have become practical in modern TEMs due to the high brightness of field emission sources combined with the short mean free paths associated with both elastic and inelastic scattering of incident electrons by the specimen. However, development of electron diffraction as a quantitative discipline has been limited by the absence of any generalised theory for dynamical inelastic scattering. These problems have been simplified by recent innovations, principally the introduction of spectrometers such as the Gatan imaging filter (GIF) and the Zeiss omega filter, which remove the inelastic electrons, combined with annual improvements in the speed of computer workstations and the availability of solid-state detectors with high resolution, sensitivity and dynamic range.Comparison of experimental data with dynamical calculations imposes stringent requirements on the specimen and the electron optics, even when the inelastic component has been removed. For example, no experimental CBED pattern ever has perfect symmetry, departures from the ideal being attributable to residual strain, thickness averaging, inclined surfaces, incomplete cells and amorphous surface layers.

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