Coherent diffraction microscopy for nano-imaging of cells

2018 ◽  
Author(s):  
Guanxiao Cheng
Keyword(s):  
Nano Imaging ◽  
Diffraction Microscopy

scholarly journals Roadmap of Terahertz Imaging 2021

Sensors ◽  
2021 ◽  
Vol 21 (12) ◽  
pp. 4092
Author(s):  
Gintaras Valušis ◽  
Alvydas Lisauskas ◽  
Hui Yuan ◽  
Wojciech Knap ◽  
Hartmut G. Roskos
Keyword(s):  
Room Temperature ◽  
Continuous Wave ◽  
Computational Imaging ◽  
Imaging Systems ◽  
Thz Imaging ◽  
Operational Conditions ◽  
Frequency Combs ◽  
Wave Imaging ◽  
On Chip ◽  
Nano Imaging

In this roadmap article, we have focused on the most recent advances in terahertz (THz) imaging with particular attention paid to the optimization and miniaturization of the THz imaging systems. Such systems entail enhanced functionality, reduced power consumption, and increased convenience, thus being geared toward the implementation of THz imaging systems in real operational conditions. The article will touch upon the advanced solid-state-based THz imaging systems, including room temperature THz sensors and arrays, as well as their on-chip integration with diffractive THz optical components. We will cover the current-state of compact room temperature THz emission sources, both optolectronic and electrically driven; particular emphasis is attributed to the beam-forming role in THz imaging, THz holography and spatial filtering, THz nano-imaging, and computational imaging. A number of advanced THz techniques, such as light-field THz imaging, homodyne spectroscopy, and phase sensitive spectrometry, THz modulated continuous wave imaging, room temperature THz frequency combs, and passive THz imaging, as well as the use of artificial intelligence in THz data processing and optics development, will be reviewed. This roadmap presents a structured snapshot of current advances in THz imaging as of 2021 and provides an opinion on contemporary scientific and technological challenges in this field, as well as extrapolations of possible further evolution in THz imaging.

Critical dimension metrology using optical diffraction microscopy

2005 ◽  
Author(s):  
Niels Agersnap ◽  
Poul-Erik Hansen ◽  
Jan C. Petersen ◽  
Jørgen Garnæs ◽  
Nathalie Destouches ◽  
...  
Keyword(s):  
Critical Dimension ◽  
Optical Diffraction ◽  
Diffraction Microscopy

Non‐Local Electrostatic Gating Effect in Graphene Revealed by Infrared Nano‐Imaging

Small ◽  
2021 ◽  
pp. 2105687
Author(s):  
Aolin Deng ◽  
Cheng Hu ◽  
Peiyue Shen ◽  
Jiajun Chen ◽  
Xingdong Luo ◽  
...  
Keyword(s):  
Electrostatic Gating ◽  
Non Local ◽  
Nano Imaging ◽  
Gating Effect

Tomographic diffraction microscopy of birefringence

2021 ◽  
Author(s):  
Amirhossein Saba ◽  
Joowon Lim ◽  
Ahmed B. Ayoub ◽  
Elizabeth E. Antoine ◽  
Demetri Psaltis
Keyword(s):  
Diffraction Microscopy

Measuring stress-induced martensite microstructures using far-field high-energy diffraction microscopy

2018 ◽  
Vol 74 (5) ◽  
pp. 425-446 ◽  
Author(s):  
Ashley Nicole Bucsek ◽  
Darren Dale ◽  
Jun Young Peter Ko ◽  
Yuriy Chumlyakov ◽  
Aaron Paul Stebner
Keyword(s):  
Phase Transformation ◽  
Three Dimensional ◽  
Infinite Plate ◽  
Direct Analysis ◽  
High Energy ◽  
Data Sets ◽  
Far Field ◽  
X Ray Diffraction ◽  
Parent Austenite ◽  
Diffraction Microscopy

Modern X-ray diffraction techniques are now allowing researchers to collect long-desired experimental verification data sets that are in situ, three-dimensional, on the same length scales as critical microstructures, and using bulk samples. These techniques need to be adapted for advanced material systems that undergo combinations of phase transformation, twinning and plasticity. One particular challenge addressed in this article is direct analysis of martensite phases in far-field high-energy diffraction microscopy experiments. Specifically, an algorithmic forward model approach is presented to analyze phase transformation and twinning data sets of shape memory alloys. In the present implementation of the algorithm, the crystallographic theory of martensite (CTM) is used to predict possible martensite microstructures (i.e. martensite orientations, twin mode, habit plane, twin plane and twin phase fractions) that could form from the parent austenite structure. This approach is successfully demonstrated on three single- and near-single-crystal NiTi samples where the fundamental assumptions of the CTM are not upheld. That is, the samples have elastically strained lattices, inclusions, precipitates, subgrains, R-phase transformation and/or are not an infinite plate. The results indicate that the CTM still provides structural solutions that match the experiments. However, the widely accepted maximum work criterion for predicting which solution of the CTM should be preferred by the material does not work in these cases. Hence, a more accurate model that can simulate these additional structural complexities can be used within the algorithm in the future to improve its performance for non-ideal materials.

Methods for obtaining superresolution images in coherent x-ray diffraction microscopy

2007 ◽  
Vol 76 (3) ◽  
Author(s):  
Yukio Takahashi ◽  
Yoshinori Nishino ◽  
Tetsuya Ishikawa
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy
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