Study on the effects of ion barrier film on photon reflectance of microchannel plate input surface

2018 ◽  
Author(s):  
Yaning Guo ◽  
Feng Shi ◽  
Ziheng Hao
Keyword(s):  
Microchannel Plate ◽  
Input Surface ◽  
Barrier Film

scholarly journals Effective Evaluation of the Noise Factor of Microchannel Plate

2015 ◽  
Vol 2015 ◽  
pp. 1-6 ◽  
Author(s):  
Honggang Wang ◽  
Yujie Du ◽  
Yu Feng ◽  
Yang Lv ◽  
Xiaoming Hu ◽  
...  
Keyword(s):  
Electron Energy ◽  
Area Ratio ◽  
Microchannel Plate ◽  
Noise Factor ◽  
Noise Performance ◽  
Open Area ◽  
Effective Evaluation ◽  
Noise Characteristics ◽  
The Cost ◽  
Barrier Film

To improve the noise performance of microchannel plate (MCP), we have presented a method using the sine random signals with Poisson distribution as the noise-excitation for electron source. By using this method, the effective evaluation of noise characteristics of MCP has been implemented through measuring and analyzing its noise factor. The results have demonstrated that the noise factor of filmed MCP is lower than 1.8. Additionally, as the open area ratio and the input electron energy are 72% and 400 eV, respectively, the noise characteristics of unfilmed MCP are improved evidently. Moreover, larger open area ratio, higher input electron energy, and higher voltage across the MCP all can reduce effectively the noise factor within a certain range. Meanwhile, the ion barrier film extends the life of image tube but at the cost of an increased noise factor. Therefore, it is necessary that a compromise between the optimum thickness of ion barrier film, open area ratio, input electron energy, and voltage across the MCP must be reached.

The Formation of Super-Thin Dielectric Film on Porous Substrate and its Stopping – Transmittance Characteristics for Particles

2011 ◽  
Vol 328-330 ◽  
pp. 1305-1308
Author(s):  
Li Chen ◽  
Ye Li ◽  
Xu Lei Qin ◽  
Kui Wu ◽  
De Long Jiang ◽  
...  
Keyword(s):  
Dielectric Film ◽  
New Technology ◽  
Microchannel Plate ◽  
Porous Substrate ◽  
Operating Life ◽  
Carbon Contamination ◽  
The Third ◽  
Direct Formation ◽  
Measurement Principle ◽  
Barrier Film

The formation of super-thin continuous dielectric film (e.g. the ion barrier film-IBF) on microchannel plate (a kind of porous substrate) is most important for prolonging the operating life of the third generation micro-light image tube. In this paper, firstly, the formation of Al2O3 ion barrier film on microchannel plate (MCP) using a new contamination-free technology was introduced. According to the analysis and the comparison with the traditional direct formation technology, it was found that the productivity of the new technology is better (90%) and the carbon contamination can be minimized. Next, the stopping and transmittance characteristic of the film for electrons were studied and the measurement principle was shown. In this measurement, the concepts of “dead-voltage” and “electron transmittance” were proposed to evaluate the stopping and transmittance of the film for electrons. The dead-voltage was 220V for the MCP covered the ion barrier film with a thickness of 5nm and the electron transmittance was over 90%.

scholarly journals Experimental Study of Carbon Pollution Removal from Microchannel Plate with Ion Barrier Film

2020 ◽  
Vol 42 (8) ◽  
pp. 747-751
Author(s):  
峰 刘 ◽  
妮 张 ◽  
宏立 师 ◽  
旭川 刘 ◽  
丹 李 ◽  
...  
Keyword(s):  
Experimental Study ◽  
Microchannel Plate ◽  
Pollution Removal ◽  
Barrier Film

Monte-Carlo Simulations on The Stopping and Transmittance Characteristics of Particles in The Ion Barrier Film of Microchannel Plate

2011 ◽  
Vol 32 (8) ◽  
pp. 816-820
Author(s):  
姜德龙 JIANG De-long ◽  
房立峰 FANG Li-feng ◽  
那延祥 NA Yan-xiang ◽  
李野 LI Ye ◽  
田景全 TIAN Jing-quan
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Microchannel Plate ◽  
Barrier Film

Noise factor of microchannel plate with ion barrier film

2012 ◽  
Author(s):  
Shu-lin Liu ◽  
Feng Shi ◽  
Zhou-kui Li ◽  
Yu-feng Zhu ◽  
Ni Zhang ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Noise Factor ◽  
Barrier Film

Effect of energy filtering on micro-diffraction in the SEM

1994 ◽  
Vol 52 ◽  
pp. 604-605
Author(s):  
James F. Mancuso ◽  
Leo A. Fama ◽  
William B. Maxwell ◽  
Jerry L. Lehman ◽  
Hasso Weiland ◽  
...  
Keyword(s):  
Detection Efficiency ◽  
Ccd Camera ◽  
High Gain ◽  
Microchannel Plate ◽  
Electrostatic Energy ◽  
Energy Filtering ◽  
Electron Channelling ◽  
Low Energy Electrons ◽  
Low Sensitivity ◽  
Angular Field Of View

Micro-diffraction based crystallography is essential to the design and development of many classes of ‘crafted materials’. Although the scanning electron microscope can provide crystallographic information with high spatial resolution, its current utility is severely limited by the low sensitivity of existing diffraction techniques (ref: Dingley). Previously, Joy showed that energy filtering increased contrast and pattern visibility in electron channelling. This present paper discribes the effect of energy filtering on EBSP sensitivity and backscattered SEM imaging.The EBSP detector consisted of an electron energy filter, a microchannel plate detector, a phosphor screen, optical coupler, and a slow scan CCD camera. The electrostatic energy filter used in this experiment was constructed as a cone with 5 coaxial electrodes. The angular field-of-view of the filter was approximately 38°. The microchannel plate, which was the initial sensing component, had high gain and had 50% to 80% detection efficiency for the low energy electrons that passed through the retarding field filter.

Low - Voltage Scanning Electron Microscopy Imaging, Secondary and Backscatter, With Microchannel Plate Detector

1990 ◽  
Vol 48 (1) ◽  
pp. 442-442
Author(s):  
Galen Powers ◽  
Ray Cochran
Keyword(s):  
Low Voltage ◽  
Beam Current ◽  
Microchannel Plate ◽  
Normal Operation ◽  
Microscopy Imaging ◽  
Backscatter Signal ◽  
Vacuum Interface ◽  
Width Measurements ◽  
Working Distance ◽  
Beam Currents

The capability to obtain symmetrical images at voltages as low as 200 eV and beam currents less than 9 pico amps is believed to be advantageous for metrology and study of dielectric or biological samples. Symmetrical images should allow more precise and accurate line width measurements than currently achievable by traditional secondary electron detectors. The low voltage and current capability should allow imaging of samples which traditionally have been difficult because of charging or electron beam damage.The detector system consists of a lens mounted dual anode MicroChannel Plate (MCP) detector, vacuum interface, power supplies, and signal conditioning to interface directly to the video card of the SEM. The detector has been miniaturized so that it does not interfere with normal operation of the SEM sample handling and alternate detector operation. Biasing of the detector collection face will either add secondaries to the backscatter signal or reject secondaries yielding only a backscatter image. The dual anode design allows A−B signal processing to provide topological information as well as symmetrical A+B images.Photomicrographs will show some of the system capabilities. Resolution will be documented with gold on carbon. Variation of voltage, beam current, and working distance on dielectric samples such as glass and photoresist will demonstrate effects of common parameter changes.

Wind Input, Surface Dissipation and Directional Properties in Shoaling Waves

2000 ◽  
Author(s):  
Hans C. Graber ◽  
Mark A. Donelan ◽  
William M. Drennan ◽  
Fred W. Dobson
Keyword(s):  
Input Surface ◽  
Wind Input ◽  
Shoaling Waves
Sign in / Sign up

Export Citation Format

Share Document