scholarly journals The NEID precision radial velocity spectrometer: port adapter overview, requirements, and test plan

Author(s):  
Jeffrey W. Percival ◽  
Jayadev Rajagopal ◽  
Samuel Halverson ◽  
Lawrence W. Ramsey ◽  
Arpita Roy ◽  
...  
Keyword(s):  
1965 ◽  
Vol 5 ◽  
pp. 109-111
Author(s):  
Frederick R. West

There are certain visual double stars which, when close to a node of their relative orbit, should have enough radial velocity difference (10-20 km/s) that the spectra of the two component stars will appear resolved on high-dispersion spectrograms (5 Å/mm or less) obtainable by use of modern coudé and solar spectrographs on bright stars. Both star images are then recorded simultaneously on the spectrograph slit, so that two stellar components will appear on each spectrogram.


1976 ◽  
Vol 32 ◽  
pp. 613-622
Author(s):  
I.A. Aslanov ◽  
Yu.S. Rustamov

SummaryMeasurements of the radial velocities and magnetic field strength of β CrB were carried out. It is shown that there is a variability with the rotation period different for various elements. The curve of the magnetic field variation measured from lines of 5 different elements: FeI, CrI, CrII, TiII, ScII and CaI has a complex shape specific for each element. This may be due to the presence of magnetic spots on the stellar surface. A comparison with the radial velocity curves suggests the presence of a least 4 spots of Ti and Cr coinciding with magnetic spots. A change of the magnetic field with optical depth is shown. The curve of the Heffvariation with the rotation period is given. A possibility of secular variations of the magnetic field is shown.


2015 ◽  
Vol 71-72 ◽  
pp. 127-128
Author(s):  
B.J. Hrivnak ◽  
W. Lu ◽  
G. Van de Steene ◽  
H. Van Winckel ◽  
J. Sperauskas ◽  
...  

1994 ◽  
Author(s):  
D. Krohman ◽  
S. Smith ◽  
K. Stone ◽  
R. Knudston
Keyword(s):  

2018 ◽  
Author(s):  
Michael H. Azarian

Abstract As counterfeiting techniques and processes grow in sophistication, the methods needed to detect these parts must keep pace. This has the unfortunate effect of raising the costs associated with managing this risk. In order to ensure that the resources devoted to counterfeit detection are commensurate with the potential effects and likelihood of counterfeit part usage in a particular application, a risk based methodology has been adopted for testing of electrical, electronic, and electromechanical (EEE) parts by the SAE AS6171 set of standards. This paper provides an overview of the risk assessment methodology employed within AS6171 to determine the testing that should be utilized to manage the risk associated with the use of a part. A scenario is constructed as a case study to illustrate how multiple solutions exist to address the risk for a particular situation, and the choice of any specific test plan can be made on the basis of practical considerations, such as cost, time, or the availability of particular test equipment.


Sign in / Sign up

Export Citation Format

Share Document