Functional tolerancing using full surface metrology

2018 ◽  
Author(s):  
Katherine Ballman ◽  
Christopher Lee ◽  
Robert Grejda
Keyword(s):  
Surface Metrology ◽  
Functional Tolerancing

Research progress of high-precision surface metrology of a K-B mirror

2020 ◽  
Vol 13 (4) ◽  
pp. 660-675
Author(s):  
ZHANG Shuai ◽  
◽  
◽  
HOU Xi ◽  
◽  
...  
Keyword(s):  
High Precision ◽  
Research Progress ◽  
Surface Metrology

scholarly journals Nano-imprinted subwavelength gratings as polarizing beamsplitters

2021 ◽  
Vol 17 (1) ◽  
Author(s):  
Julian Wüster ◽  
Yannick Bourgin ◽  
Patrick Feßer ◽  
Arne Behrens ◽  
Stefan Sinzinger
Keyword(s):  
Nanoimprint Lithography ◽  
Optical Measurement ◽  
Design Method ◽  
Optical Systems ◽  
Surface Metrology ◽  
Measurement Systems ◽  
Common Path ◽  
Dielectric Coatings ◽  
Subwavelength Gratings ◽  
Wide Range

AbstractPolarizing beamsplitters have numerous applications in optical systems, such as systems for freeform surface metrology. They are classically manufactured from birefringent materials or with stacks of dielectric coatings. We present a binary subwavelength-structured form-birefringent diffraction grating, which acts as a polarizing beamsplitter for a wide range of incidence angles −30∘…+30∘. We refine the general design method for such hybrid gratings. We furthermore demonstrate the manufacturing steps with Soft-UV-Nanoimprint-Lithography, as well as the experimental verification, that the structure reliably acts as a polarizing beamsplitter. The experimental results show a contrast in efficiency for TE- and TM-polarization of up to 1:18 in the first order, and 34:1 in the zeroth order. The grating potentially enables us to realize integrated compact optical measurement systems, such as common-path interferometers.

Intracavity beam shaping for nanoscale surface metrology

2003 ◽  
Author(s):  
Boris Spektor ◽  
Yurij Parkhomenko ◽  
Josef Shamir
Keyword(s):  
Beam Shaping ◽  
Surface Metrology

Forensic surface metrology: tool mark evidence

Scanning ◽  
2011 ◽  
Vol 33 (5) ◽  
pp. 272-278 ◽  
Author(s):  
Carol Gambino ◽  
Patrick McLaughlin ◽  
Loretta Kuo ◽  
Frani Kammerman ◽  
Peter Shenkin ◽  
...  
Keyword(s):  
Surface Metrology ◽  
Tool Mark
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