Design of semi-physical fault simulation platform for Antarctic telescopes

2018 ◽  
Author(s):  
Shihai Yang ◽  
Yun Li ◽  
Jiajia Wu ◽  
Dandan Xu
Keyword(s):  
Fault Simulation ◽  
Simulation Platform

Construction of network fault simulation platform and event samples acquisition techniques for event correlation

2001 ◽  
Vol 6 (3) ◽  
pp. 670-674
Author(s):  
Su Yu-bei ◽  
Wang Zhi ◽  
Cao Yang ◽  
Huang Tian-xi ◽  
Wang Li-na
Keyword(s):  
Fault Simulation ◽  
Simulation Platform ◽  
Event Correlation ◽  
Network Fault

scholarly journals Fault simulation platform of gear transmission system based on Labview

2019 ◽  
Vol 242 ◽  
pp. 032052
Author(s):  
Junguo Wang ◽  
Yang Yang ◽  
Rui Sun ◽  
Minqiang Ren ◽  
Yongxiangn Zhao
Keyword(s):  
Fault Simulation ◽  
Transmission System ◽  
Gear Transmission ◽  
Simulation Platform ◽  
Gear Transmission System

A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Extend ATPG Diagnostic Resolution in Localizing Faults

2019 ◽  
Author(s):  
Rommel Estores ◽  
Karo Vander Gucht
Keyword(s):  
Fault Injection ◽  
Fault Simulation ◽  
Fault Localization ◽  
Pattern Generation ◽  
Test Coverage ◽  
Actual Case ◽  
Electrical Failure ◽  
Starting Point ◽  
Diagnostic Resolution ◽  
Diagnosis Approach

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

Sign in / Sign up

Export Citation Format

Share Document