Application of speckle shearing interferometry to the evaluation of creep strain in elastomers

Optifab 2017 ◽  
2017 ◽  
Author(s):  
Juan Benito Pascual Francisco ◽  
Alexandre V. Michtchenko ◽  
Orlando Susarrey Huerta ◽  
Omar Barragán-Pérez ◽  
Antonio de Jesús Ortiz Gonzáles
Keyword(s):  
Creep Strain ◽  
Shearing Interferometry

Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry

2018 ◽  
Author(s):  
Juan Benito Pascual Francisco ◽  
Omar Barragán-Pérez ◽  
Orlando Susarrey Huerta ◽  
Alexandre V. Michtchenko
Keyword(s):  
Creep Strain ◽  
Speckle Pattern ◽  
Shearing Interferometry

Circumferential Creep Strain of Cylinders Subjected to Internal Pressure: A Comparison of the Theories of Johnson and Bailey

1966 ◽  
Vol 8 (1) ◽  
pp. 22-26 ◽  
Author(s):  
E. C. Larke ◽  
R. J. Parker
Keyword(s):  
Internal Pressure ◽  
Creep Strain ◽  
Wall Thickness ◽  
Circumferential Strain ◽  
Axial Stress ◽  
Integration Procedure ◽  
Graphical Integration ◽  
Simple Equations

When considering the creep of cylinders subjected to internal pressure, the theory of Johnson et al. takes into account progressive changes of radial, circumferential and axial stress at any point in the wall thickness. This approach differs from that put forward by Bailey, who assumed that these stresses remained constant with time. The present paper summarizes an examination of both theories, with particular reference to outside and bore diameters, and presents simple equations which enable circumferential strain to be calculated without using the complex graphical integration procedure suggested by Johnson. Furthermore, it is demonstrated that these equations are mathematically identical with those derived by Bailey.

scholarly journals Optical arbitrary waveform characterization via dual-quadrature spectral shearing interferometry

2009 ◽  
Vol 17 (5) ◽  
pp. 3381 ◽  
Author(s):  
Houxun Miao ◽  
Daniel E. Leaird ◽  
Carsten Langrock ◽  
Martin M. Fejer ◽  
Andrew M. Weiner
Keyword(s):  
Shearing Interferometry ◽  
Arbitrary Waveform

An approach to the determination of cyclic creep strain

1979 ◽  
Vol 11 (11) ◽  
pp. 1225-1229 ◽  
Author(s):  
V. P. Golub
Keyword(s):  
Creep Strain ◽  
Cyclic Creep

Study on Measurement of Thin Film Thickness with Lateral Shearing Interferometry

2013 ◽  
Vol 718-720 ◽  
pp. 848-852
Author(s):  
Jun Hong Su ◽  
Ying Shi ◽  
Jin Man Ge
Keyword(s):  
Film Thickness ◽  
Transform Method ◽  
Shearing Interferometry ◽  
Platform Process ◽  
Fast Fourier Transform Method ◽  
Lateral Shearing ◽  
Phase Unwrap ◽  
Technical Indicator ◽  
Lateral Shearing Interferometry ◽  
Shearing Interference

The film thickness is an important technical indicator of film devices, and its accuracy directly affects various performances of optical components. In fabrication process of film device, fast and accurate measurement of film thickness has positive significance on product quality control. In this paper, measure film thickness with lateral shearing interferometry. Collect interferograms through structured lateral shearing interference platform, process interferogram with Fast Fourier Transform method to extract phase, unwrap the wrapped phase to achieve phase value. Finally, calculate film thickness based on lateral shearing interference principle. The thickness of sample is 119.6800nm measured by this method, basically the same with the result 120.6036nm that measured by ZYGO interferometer. This experiment shows that lateral shearing interferometry not only suit to measurement of film thickness, but also abundant high-precision method of measuring film thickness, and has high practical value.

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