Single-grating Talbot imaging for wavefront sensing and x-ray metrology

Author(s):  
Walan C. Grizolli ◽  
Xianbo Shi ◽  
Lahsen Assoufid ◽  
Tomasz Kolodziej ◽  
Yuri Shvyd’ko
Keyword(s):  
2020 ◽  
Vol 27 (2) ◽  
pp. 293-304 ◽  
Author(s):  
Sebastien Berujon ◽  
Ruxandra Cojocaru ◽  
Pierre Piault ◽  
Rafael Celestre ◽  
Thomas Roth ◽  
...  

A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284–292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.


2011 ◽  
Author(s):  
Timo T. Saha ◽  
Scott Rohrbach ◽  
William W. Zhang ◽  
Tyler C. Evans ◽  
Melinda Hong

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Bob Nagler ◽  
Andrew Aquila ◽  
Sébastien Boutet ◽  
Eric C. Galtier ◽  
Akel Hashim ◽  
...  

2015 ◽  
Vol 23 (18) ◽  
pp. 23310 ◽  
Author(s):  
Hongchang Wang ◽  
Yogesh Kashyap ◽  
Kawal Sawhney

2020 ◽  
Vol 27 (2) ◽  
pp. 254-261 ◽  
Author(s):  
Yanwei Liu ◽  
Matthew Seaberg ◽  
Yiping Feng ◽  
Kenan Li ◽  
Yuantao Ding ◽  
...  

Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1 m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.


Optica ◽  
2018 ◽  
Vol 5 (8) ◽  
pp. 967 ◽  
Author(s):  
Yanwei Liu ◽  
Matthew Seaberg ◽  
Diling Zhu ◽  
Jacek Krzywinski ◽  
Frank Seiboth ◽  
...  

2009 ◽  
Vol 20 (12) ◽  
pp. 20
Author(s):  
Manuel Guizar-Sicairos ◽  
Gregory R. Brady ◽  
James R. Fienup

2004 ◽  
Author(s):  
Timm Weitkamp ◽  
A. Diaz ◽  
Bernd Nohammer ◽  
Franz Pfeiffer ◽  
Marco Stampanoni ◽  
...  

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