Development of a high performance surface slope measuring system for two-dimensional mapping of x-ray optics

Author(s):  
Ian Lacey ◽  
Jérôme Adam ◽  
Gary P. Centers ◽  
Gevork S. Gevorkyan ◽  
Sergey M. Nikitin ◽  
...  
2011 ◽  
Vol 681 ◽  
pp. 19-24
Author(s):  
Bob B. He

Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.


2005 ◽  
Vol 44 (No. 31) ◽  
pp. L998-L1001 ◽  
Author(s):  
Masami Ando ◽  
Katsuhito Yamasaki ◽  
Chiho Ohbayashi ◽  
Hiroyasu Esumi ◽  
Kazuyuki Hyodo ◽  
...  

2019 ◽  
Vol 11 (10) ◽  
pp. 9679-9684 ◽  
Author(s):  
Qiang Xu ◽  
Wenyi Shao ◽  
Yang Li ◽  
Xinlei Zhang ◽  
Xiao Ouyang ◽  
...  

2005 ◽  
Author(s):  
Valeriy V. Yashchuk ◽  
Steve C. Irick ◽  
Eric M. Gullikson ◽  
Malcolm R. Howells ◽  
Alastair A. MacDowell ◽  
...  

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