Application of time-invariant linear filter approximation to parametrization of one- and two-dimensional surface metrology with high quality x-ray optics

2013 ◽  
Author(s):  
Valeriy V. Yashchuk ◽  
Yury N. Tyurin ◽  
Anastasia Y. Tyurina
Keyword(s):  
Linear Filter ◽  
Surface Metrology ◽  
Two Dimensional ◽  
High Quality ◽  
Ray Optics ◽  
X Ray ◽  
Filter Approximation ◽  
Time Invariant ◽  
Dimensional Surface

scholarly journals High precision surface metrology of x-ray optics with an interferometric microscope

2013 ◽  
Author(s):  
Ian Lacey ◽  
Nikolay A. Artemiev ◽  
Wayne R. McKinney ◽  
Daniel J. Merthe ◽  
Valeriy V. Yashchuk
Keyword(s):  
High Precision ◽  
Surface Metrology ◽  
Ray Optics ◽  
X Ray

scholarly journals Cross-check of different techniques for two-dimensional power spectral density measurements of x-ray optics

2005 ◽  
Author(s):  
Valeriy V. Yashchuk ◽  
Steve C. Irick ◽  
Eric M. Gullikson ◽  
Malcolm R. Howells ◽  
Alastair A. MacDowell ◽  
...  
Keyword(s):  
Spectral Density ◽  
Power Spectral Density ◽  
Two Dimensional ◽  
Ray Optics ◽  
Density Measurements ◽  
X Ray ◽  
Power Spectral

Correlation analysis of surface slope metrology measurements of high quality x-ray optics

2013 ◽  
Author(s):  
Valeriy V. Yashchuk ◽  
Nikolay A. Artemiev ◽  
Ian Lacey ◽  
Daniel J. Merthe
Keyword(s):  
Correlation Analysis ◽  
Surface Slope ◽  
High Quality ◽  
Ray Optics ◽  
X Ray

scholarly journals Analytical formula for two-dimensional ring artefact suppression

2016 ◽  
Vol 23 (6) ◽  
pp. 1447-1461 ◽  
Author(s):  
Valeriy Titarenko
Keyword(s):  
Analytical Formula ◽  
Two Dimensional ◽  
Ray Optics ◽  
X Ray ◽  
Flat Field ◽  
Additional Processing

Ring artefacts are the most disturbing artefacts when reconstructed volumes are segmented. A lot of effort has already been put into better X-ray optics, scintillators and detectors in order to minimize the appearance of these artefacts. However, additional processing is often required after standard flat-field correction. Several methods exist to suppress artefacts. One group of methods is based on minimization of the Tikhonov functional. An analytical formula for processing of a single sinogram was developed. In this paper a similar approach is used and a formula for processing two-dimensional projections is found. Thus suppression of ring artefacts is organized as a two-dimensional convolution of `averaged' projections with a given filter. Several approaches are discussed in order to find elements of the filter in a faster and accurate way. Examples of experimental datasets processed by the proposed method are considered.

scholarly journals Wide-field X-ray Optics

1995 ◽  
Vol 151 ◽  
pp. 435-438
Author(s):  
René Hudec ◽  
Adolf Inneman ◽  
Ladislav Pina ◽  
Petr Řehák ◽  
Paul Gorenstein
Keyword(s):  
Field Of View ◽  
Innovative Technology ◽  
Wide Field ◽  
Two Dimensional ◽  
Ray Optics ◽  
X Ray ◽  
Field Imaging ◽  
Wide Field Imaging ◽  
Lobster Eye

AbstractClassical X-ray mirror optics usually has a limited Field of View (FoV) of ∼ 1°. Wide-field imaging can be achieved by lobster-eye type reflecting X-ray optics. We summarise several different approaches and suggest an innovative technology for the production of X-ray reflecting flats and cells necessary to develop one- or two-dimensional wide-field X-ray optics. The technology is based on double-sided, replicated reflecting foils produced by electroforming and CF/composite technologies.

MicroGap Area Detector for Stress and Texture Analysis

2011 ◽  
Vol 681 ◽  
pp. 19-24
Author(s):  
Bob B. He
Keyword(s):  
Texture Analysis ◽  
High Performance ◽  
High Efficiency ◽  
X Rays ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Large Area ◽  
Ray Optics ◽  
X Ray ◽  
Area Detector

Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.

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