Lightweight and high-resolution single crystal silicon optics for x-ray astronomy

Author(s):  
William W. Zhang ◽  
Michael P. Biskach ◽  
Kai-Wing Chan ◽  
James R. Mazzarella ◽  
Ryan S. McClelland ◽  
...  
1981 ◽  
Vol 25 ◽  
pp. 365-371
Author(s):  
Glen A. Stone

This paper presents a new method to measure the thickness of very thin films on a substrate material using energy dispersive x-ray diffractometry. The method can be used for many film-substrate combinations. The specific application to be presented is the measurement of phosphosilicate glass films on single crystal silicon wafers.


Author(s):  
Raul E. Riveros ◽  
Michael P. Biskach ◽  
Kim D. Allgood ◽  
John D. Kearney ◽  
William W. Zhang ◽  
...  

2020 ◽  
Vol 65 (6) ◽  
pp. 827-831
Author(s):  
M. S. Folomeshkin ◽  
A. S. Boikova ◽  
Yu. A. Volkovsky ◽  
M. A. Marchenkova ◽  
P. A. Prosekov ◽  
...  

2014 ◽  
Author(s):  
Raul E. Riveros ◽  
Vincent T. Bly ◽  
Linette D. Kolos ◽  
Kevin P. McKeon ◽  
James R. Mazzarella ◽  
...  

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