scholarly journals Transformation optics relay lens design for imaging from a curved to a flat surface

2016 ◽  
Author(s):  
Julia Wetherill ◽  
Richard Lepkowicz ◽  
Ramzi Zahreddine ◽  
Mark Neifeld
Keyword(s):  
Flat Surface ◽  
Transformation Optics ◽  
Lens Design

Gradient-index lens design with quasi-conformal transformation optics for energy concentration

2013 ◽  
Author(s):  
Douglas H. Werner ◽  
Jeremiah P. Turpin ◽  
Donovan Brocker ◽  
Xiande Wang ◽  
Zhi Hao Jiang ◽  
...  
Keyword(s):  
Conformal Transformation ◽  
Transformation Optics ◽  
Energy Concentration ◽  
Lens Design ◽  
Gradient Index ◽  
Gradient Index Lens

Meta-lens design with low permittivity dielectric materials through smart transformation optics

2015 ◽  
Vol 107 (10) ◽  
pp. 101906 ◽  
Author(s):  
Junhyun Kim ◽  
Dongheok Shin ◽  
Seungjae Choi ◽  
Do-Sik Yoo ◽  
Ilsung Seo ◽  
...  
Keyword(s):  
Dielectric Materials ◽  
Transformation Optics ◽  
Lens Design ◽  
Low Permittivity

Advancements in transformation optics-enabled gradient-index lens design

2015 ◽  
Author(s):  
Sawyer D. Campbell ◽  
Donovan E. Brocker ◽  
Jogender Nagar ◽  
John A. Easum ◽  
Douglas H. Werner ◽  
...  
Keyword(s):  
Transformation Optics ◽  
Lens Design ◽  
Gradient Index ◽  
Gradient Index Lens

Recent developments in automated Transmission Electron MI

1989 ◽  
Vol 47 ◽  
pp. 46-47
Author(s):  
W.J. de Ruijter ◽  
P. Rez ◽  
David J. Smith
Keyword(s):  
Image Analysis ◽  
Computer Image ◽  
Lens Design ◽  
Computer Image Analysis ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Recent Developments ◽  
On Line ◽  
Routine Procedures ◽  
Near Future

There is growing interest in the on-line use of computers in high-resolution electron n which should reduce the demands on highly skilled operators and thereby extend the r of the technique. An on-line computer could obviously perform routine procedures hand, or else facilitate automation of various restoration, reconstruction and enhan These techniques are slow and cumbersome at present because of the need for cai micrographs and off-line processing. In low resolution microscopy (most biologic; primary incentive for automation and computer image analysis is to create a instrument, with standard programmed procedures. In HREM (materials researc computer image analysis should lead to better utilization of the microscope. Instru (improved lens design and higher accelerating voltages) have improved the interpretab the level of atomic dimensions (approximately 1.6 Å) and instrumental resolutior should become feasible in the near future.

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

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