Optical characterization of SiO2thin films using universal dispersion model over wide spectral range

2016 ◽  
Author(s):  
Daniel Franta ◽  
David Nečas ◽  
Ivan Ohlídal ◽  
Angelo Giglia
Keyword(s):  
Spectral Range ◽  
Dispersion Model ◽  
Optical Characterization ◽  
Wide Spectral Range

Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride

2017 ◽  
Vol 421 ◽  
pp. 424-429 ◽  
Author(s):  
Daniel Franta ◽  
David Nečas ◽  
Angelo Giglia ◽  
Pavel Franta ◽  
Ivan Ohlídal
Keyword(s):  
Thin Films ◽  
Spectral Range ◽  
Dispersion Model ◽  
Magnesium Fluoride ◽  
Wide Spectral Range

Optical characterization in wide spectral range by a coherent spectrophotometer

2003 ◽  
Author(s):  
Valdas Sirutkaitis ◽  
Robert C. Eckardt ◽  
Ona Balachninaite ◽  
Rimantas Grigonis ◽  
A. Melninkaitis ◽  
...  
Keyword(s):  
Spectral Range ◽  
Optical Characterization ◽  
Wide Spectral Range

Dispersion model for optical thin films applicable in wide spectral range

2015 ◽  
Author(s):  
Daniel Franta ◽  
David Nečas ◽  
Ivan Ohlídal ◽  
Angelo Giglia
Keyword(s):  
Thin Films ◽  
Spectral Range ◽  
Dispersion Model ◽  
Wide Spectral Range

Crystal Growth and Electro-optical Characterization of In2Se2.7Sb0.3 Compound

2020 ◽  
Vol 12 (4) ◽  
pp. 04022-1-04022-4
Author(s):  
Piyush Patel ◽  
◽  
S. M. Vyas ◽  
Vimal Patel ◽  
Himanshu Pavagadhi ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Optical Characterization
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