Confocal position alignment in high-precision wavefront error metrology using Shack-Hartmann wavefront sensor

2016 ◽  
Author(s):  
Jiani Su ◽  
Zengxiong Lu ◽  
Yuejing Qi ◽  
Guangyi Liu ◽  
Qingbin Meng
Keyword(s):  
High Precision ◽  
Wavefront Sensor ◽  
Wavefront Error

Fabrication of Computer Generated Hologram for Aspheric Surface Measurement

2016 ◽  
Vol 1136 ◽  
pp. 620-623
Author(s):  
Zhi Yu Zhang ◽  
Xu Yang ◽  
Li Gong Zheng
Keyword(s):  
Line Width ◽  
High Precision ◽  
Glass Substrate ◽  
Semiconductor Industry ◽  
Position Error ◽  
Surface Measurement ◽  
High Precision Measurement ◽  
Aspheric Surfaces ◽  
Wavy Line ◽  
Wavefront Error

High-precision aspheric surfaces are generally measured using interferometer with a computer-generated holograms (CGH), which has a wavy line pattern fabricated onto a glass substrate. CGH patterns are generally made using lithographic techniques that was developed for semiconductor industry. Patterns can be subsequently etched into glass substrate using reactive ion or chemical etching. The accuracy of the drawn pattern on a CGH decides the accuracy of the measurement. Draw pattern error mainly includes the line-width deviation and its position error. In this paper, the influences of defocus of drawing laser and the wet-etching processes on the line-width were firstly investigated. On the other hand, the position error under different line-width was obtained by analyzing the relationship of line-width error and the position error. Based on the above-obtained results, a CGH having a diameter of 80 mm and the minimum line-width of 1.8 μm was successfully fabricated. Testing results showed that the wavefront error was only 3.79 nm, significantly higher than the commercial-available ones. The fabricated CGH is expected to use in the high-precision measurement of asphercal surfaces.

scholarly journals Correlation matching method for high-precision position detection of optical vortex using Shack–Hartmann wavefront sensor

2012 ◽  
Vol 20 (24) ◽  
pp. 26099 ◽  
Author(s):  
Chenxi Huang ◽  
Hongxin Huang ◽  
Haruyoshi Toyoda ◽  
Takashi Inoue ◽  
Huafeng Liu
Keyword(s):  
High Precision ◽  
Optical Vortex ◽  
Wavefront Sensor ◽  
Matching Method ◽  
Position Detection ◽  
Correlation Matching

scholarly journals Initial Antinoise Performance Analysis of Pupil Phase Diversity Based on Genetic Algorithm

2013 ◽  
Vol 2013 ◽  
pp. 1-5
Author(s):  
Huizhen Yang ◽  
Yaoqiu Li
Keyword(s):  
Genetic Algorithm ◽  
Performance Analysis ◽  
Output Signal ◽  
Noise Level ◽  
Wavefront Sensor ◽  
Phase Diversity ◽  
Restoration Algorithm ◽  
Wavefront Error ◽  
Simulation Results ◽  
Phase Visualization

Pupil phase diversity (PPD) wavefront sensor is a new kind of phase-visualization methods, and the output signal of PPD represents the input pupil phase and shows a 1-1 mapping between the position of the wavefront error in the pupil and its position in the output signal. High-precisely wavefront measuring can be obtained under no noise by using appropriate phase restoration algorithm while performance of PPD under noise is unknown. We analyzed antinoise performance of PPD based on genetic algorithm (GA) through measuring the distorted wavefront under different noise level. Simulation results show that wavefront measuring is almost not affected by the existence of noise, which indicates that PPD based on GA can be used in applications with noise.

scholarly journals High precision wavefront control in point spread function engineering for single emitter localization

2018 ◽  
Author(s):  
M. Siemons ◽  
C. N. Hulleman ◽  
R. Ø. Thorsen ◽  
C. S. Smith ◽  
S. Stallinga
Keyword(s):  
High Precision ◽  
Point Spread Function ◽  
Time Window ◽  
Wavefront Aberration ◽  
Wavefront Control ◽  
Point Spread ◽  
Spread Function ◽  
Wavefront Error ◽  
Single Emitter ◽  
Emitter Localization

AbstractPoint spread function (PSF) engineering is used in single emitter localization to measure the emitter position in 3D and possibly other parameters such as the emission color or dipole orientation as well. Advanced PSF models such as spline fits to experimental PSFs or the vectorial PSF model can be used in the corresponding localization algorithms in order to model the intricate spot shape and deformations correctly. The complexity of the optical architecture and fit model makes PSF engineering approaches particularly sensitive to optical aberrations. Here, we present a calibration and alignment protocol for fluorescence microscopes equipped with a spatial light modulator (SLM) with the goal of establishing a wavefront error well below the diffraction limit for optimum application of complex engineered PSFs. We achieve high-precision wavefront control, to a level below 20 mλ wavefront aberration over a 30 minute time window after the calibration procedure, using a separate light path for calibrating the pixel-to-pixel variations of the SLM, and alignment of the SLM with respect to the optical axis and Fourier plane within 3 µm (x/y) and 100 µm (z) error. Aberrations are retrieved from a fit of the vectorial PSF model to a bead z-stack and compensated with a residual wavefront error comparable to the error of the SLM calibration step. This well-calibrated and corrected setup makes it possible to create complex ‘3D+λ’ PSFs that fit very well to the vectorial PSF model. Proof-of-principle bead experiments show precisions below 10 nm in x, y, and λ, and below 20 nm in z over an axial range of 1 µm with 2000 signal photons and 12 background photons.

Analysis of the pinhole array illumination source for high precision wavefront error metrology

2015 ◽  
Author(s):  
Zengxiong Lu ◽  
Yuejing Qi ◽  
Qingbin Meng ◽  
Jiani Su ◽  
Guangyi Liu
Keyword(s):  
High Precision ◽  
Wavefront Error ◽  
Array Illumination ◽  
Illumination Source

A High-Precision Centroid Detecting Method for Hartmann-Shack Wavefront Sensor

2014 ◽  
Vol 41 (3) ◽  
pp. 0316002 ◽  
Author(s):  
李晶 Li Jing ◽  
巩岩 Gong Yan ◽  
呼新荣 Hu Xinrong ◽  
李春才 Li Chuncai
Keyword(s):  
High Precision ◽  
Wavefront Sensor ◽  
Detecting Method

scholarly journals An all-photonic focal-plane wavefront sensor

2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Barnaby R. M. Norris ◽  
Jin Wei ◽  
Christopher H. Betters ◽  
Alison Wong ◽  
Sergio G. Leon-Saval
Keyword(s):  
Adaptive Optics ◽  
Focal Plane ◽  
Mean Squared Error ◽  
Single Mode ◽  
Wavefront Sensor ◽  
Wavefront Sensors ◽  
Single Mode Fibre ◽  
Squared Error ◽  
Wavefront Error ◽  
Plane Wavefront

Abstract Adaptive optics (AO) is critical in astronomy, optical communications and remote sensing to deal with the rapid blurring caused by the Earth’s turbulent atmosphere. But current AO systems are limited by their wavefront sensors, which need to be in an optical plane non-common to the science image and are insensitive to certain wavefront-error modes. Here we present a wavefront sensor based on a photonic lantern fibre-mode-converter and deep learning, which can be placed at the same focal plane as the science image, and is optimal for single-mode fibre injection. By measuring the intensities of an array of single-mode outputs, both phase and amplitude information on the incident wavefront can be reconstructed. We demonstrate the concept with simulations and an experimental realisation wherein Zernike wavefront errors are recovered from focal-plane measurements to a precision of 5.1 × 10−3 π radians root-mean-squared-error.

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