Focusing and photon flux measurements of the 2.88-nm radiation at the sample plane of the soft x-ray microscope, based on capillary discharge source

Author(s):  
M. Fahad Nawaz ◽  
Alexandr Jancarek ◽  
Michal Nevrkla ◽  
Przemyslaw Wachulak ◽  
Jiri Limpouch ◽  
...  
2017 ◽  
Author(s):  
M. F. Nawaz ◽  
Alexandr Jancarek ◽  
Michal Nevrkla ◽  
Martin Jakub Duda ◽  
Ladislav Pina

2020 ◽  
Vol 10 (18) ◽  
pp. 6373
Author(s):  
Tomáš Parkman ◽  
Michal Nevrkla ◽  
Alexandr Jančárek ◽  
Jana Turňová ◽  
Dalibor Pánek ◽  
...  

We present a design of a compact transmission water-window microscope based on the Z-pinching capillary discharge nitrogen plasma source. The microscope operates at wavelength of 2.88 nm (430 eV), and with its table-top dimensions provides an alternative to large-scale soft X-ray (SXR) microscope systems based on synchrotrons and free-electron lasers. The emitted soft X-ray radiation is filtered by a titanium foil and focused by an ellipsoidal condenser mirror into the sample plane. A Fresnel zone plate was used to create a transmission image of the sample onto a charge-coupled device (CCD) camera. To assess the resolution of the microscope, we imaged a standard sample-copper mesh. The spatial resolution of the microscope is 75 nm at half-pitch, calculated via a 10–90% intensity knife-edge test. The applicability of the microscope is demonstrated by the imaging of green algae-Desmodesmus communis. This paper describes the principle of capillary discharge source, design of the microscope, and experimental imaging results of Cu mesh and biological sample.


2001 ◽  
Author(s):  
Giuseppe Tomassetti ◽  
Libero Palladino ◽  
Antonio Ritucci ◽  
Lucia Reale ◽  
Tania Limongi ◽  
...  

2016 ◽  
Vol 11 (07) ◽  
pp. P07002-P07002 ◽  
Author(s):  
M.F. Nawaz ◽  
M. Nevrkla ◽  
A. Jancarek ◽  
A. Torrisi ◽  
T. Parkman ◽  
...  

2003 ◽  
Vol 43 (2) ◽  
pp. 88-93 ◽  
Author(s):  
A. Ritucci ◽  
G. Tomassetti ◽  
A. Reale ◽  
L. Palladino ◽  
L. Reale ◽  
...  
Keyword(s):  

2021 ◽  
Vol 54 (3) ◽  
Author(s):  
Peter Nadazdy ◽  
Jakub Hagara ◽  
Petr Mikulik ◽  
Zdenko Zaprazny ◽  
Dusan Korytar ◽  
...  

A four-bounce monochromator assembly composed of Ge(111) and Ge(220) monolithic channel-cut monochromators with V-shaped channels in a quasi-dispersive configuration is presented. The assembly provides an optimal design in terms of the highest transmittance and photon flux density per detector pixel while maintaining high beam collimation. A monochromator assembly optimized for the highest recorded intensity per detector pixel of a linear detector placed 2.5 m behind the assembly was realized and tested by high-resolution X-ray diffraction and small-angle X-ray scattering measurements using a microfocus X-ray source. Conventional symmetric and asymmetric Ge(220) Bartels monochromators were similarly tested and the results were compared. The new assembly provides a transmittance that is an order of magnitude higher and 2.5 times higher than those provided by the symmetric and asymmetric Bartels monochromators, respectively, while the output beam divergence is twice that of the asymmetric Bartels monochromator. These results demonstrate the advantage of the proposed monochromator assembly in cases where the resolution can be partially sacrificed in favour of higher transmittance while still maintaining high beam collimation. Weakly scattering samples such as nanostructures are an example. A general advantage of the new monochromator is a significant reduction in the exposure time required to collect usable experimental data. A comparison of the theoretical and experimental results also reveals the current limitations of the technology of polishing hard-to-reach surfaces in X-ray crystal optics.


2013 ◽  
Vol 58 (14) ◽  
pp. 4865-4879 ◽  
Author(s):  
H-M Cho ◽  
H-J Kim ◽  
Y-N Choi ◽  
S-W Lee ◽  
H-J Ryu ◽  
...  

2009 ◽  
Vol 16 (2) ◽  
pp. 143-151 ◽  
Author(s):  
Robin L. Owen ◽  
James M. Holton ◽  
Clemens Schulze-Briese ◽  
Elspeth F. Garman

Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here, and has been tested on the macromolecular crystallography beamlines at both the Swiss Light Source, Villigen, Switzerland, and the Advanced Light Source, Berkeley, USA, at energies between 4 and 18 keV. These experiments have shown that a simple model based on energy deposition in silicon is sufficient for determining the flux incident on high-quality silicon pin diodes. The derivation and validation of this model is presented, and a web-based tool for the use of the macromolecular crystallography and wider synchrotron community is introduced.


Author(s):  
Yuanli Cheng ◽  
WangQi ◽  
Yongpeng Zhao ◽  
Bohan Luan ◽  
Yinchu Wu
Keyword(s):  

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