A novel optical coherent domain reflectometer with dual frequency modulation

2015 ◽  
Author(s):  
L. Liu ◽  
Q. Liu ◽  
X. Fan ◽  
L. Ma ◽  
J. Du ◽  
...  
2020 ◽  
Vol 459 ◽  
pp. 124766
Author(s):  
Haoyu Wang ◽  
Wenyao Liu ◽  
Ziwen Pan ◽  
Yu Tao ◽  
Jian Niu ◽  
...  

2019 ◽  
Vol 10 (1) ◽  
pp. 293
Author(s):  
In-Gyu Jang ◽  
Sung-Hyun Lee ◽  
Yong-Hwa Park

Time-of-flight (ToF) measurement technology based on the amplitude-modulated continuous-wave (AMCW) model has emerged as a state-of-the-art distance-measurement method for various engineering applications. However, many of the ToF cameras employing the AMCW process phase demodulation sequentially, which requires time latency for a single distance measurement. This can result in significant distance errors, especially in non-static environments (e.g., robots and vehicles) such as those containing objects moving relatively to the sensors. To reduce the measurement time required for a distance measurement, this paper proposes a novel, parallel-phase demodulation method. The proposed method processes phase demodulation of signal in parallel rather than sequentially. Based on the parallel phase demodulation, 2π ambiguity problem is also solved in this work by adopting dual frequency modulation to increase the maximum range while maintaining the accuracy. The performance of proposed method was verified through distance measurements under various conditions. The improved distance measurement accuracy was demonstrated throughout an extended measurement range (1–10 m).


Author(s):  
Gaurav Chawla ◽  
Santiago D. Solares

The ability of atomic force microscopy (AFM) to acquire tip-sample interaction force curves has allowed researchers to understand the mechanical behavior of numerous materials at the nanoscale. However, AFM force spectroscopy with the most commonly used techniques can be a slow process for non-uniform samples, as it often requires the measurement to be performed at one fixed surface point at a time. In this paper we present two dynamic AFM based spectroscopy methods, one requiring operation in single-frequency-modulation mode and another using dual-frequency-modulation, which could allow a more rapid acquisition of topography and tip-sample interaction force curves. Numerical simulation results are provided along with discussions on the benefits and limitations of both.


2011 ◽  
Vol 60 (5) ◽  
pp. 1861-1868 ◽  
Author(s):  
Adrian P. P. Jongenelen ◽  
Donald G. Bailey ◽  
Andrew D. Payne ◽  
Adrian A. Dorrington ◽  
Dale A. Carnegie

2019 ◽  
Vol 14 (0) ◽  
pp. 2405027-2405027 ◽  
Author(s):  
Kazuhiro SHIBATA ◽  
Hiroki SATO ◽  
Hiromasa TAKENO ◽  
Kazuya ICHIMURA ◽  
Satoshi NAKAMOTO ◽  
...  

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