Scanning electron microscope findings of the lased implant surface

1995 ◽  
Author(s):  
Tadamasu Tsuda ◽  
Koukichi Matsumoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Implant Surface ◽  
Scanning Electron

A Mechanical Evaluation of Implants Placed With Different Surgical Techniques Into the Trabecular Bone of Goats

2007 ◽  
Vol 33 (2) ◽  
pp. 51-58 ◽  
Author(s):  
Manal M. Shalabi ◽  
Johannes G. C. Wolke ◽  
Anja J. E. de Ruijter ◽  
John A. Jansen
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Statistical Significance ◽  
Surgical Techniques ◽  
Preparation Technique ◽  
Machined Surface ◽  
Implant Surface ◽  
Experimental Conditions ◽  
Removal Torque ◽  
Scanning Electron

Abstract The aim of the study was to assess the effects of surgical technique and implant surface roughness on implant fixation. A total of 48 screw implants with machined or etched surface topographies were placed into the femoral condyles of goats. The implant sites were prepared by a conventional technique, by undersized preparation, or by the osteotome technique. Bone tissue responses were evaluated after 12 weeks of healing by removal torque testing and histologic analysis using scanning electron microscope. The cumulative removal torque value of the etched implants placed with the undersized technique (98 ± 29 Ncm) was higher (50 ± 35 Ncm) to a level of statistical significance than machined surface implants placed by the osteotome technique. Scanning electron microscope evaluation indicated that all implants showed interfacial bone contact. The torque test resulted in fracture at the bone-implant interface for all experimental conditions. Installation of etched implants using an undersized preparation of the implant bed resulted in superior bonding strength with the surrounding bone at 12 weeks after surgery. Evidently, the undersized preparation technique improved the early fixation of oral implants in this study.

Decontamination of the Infected Implant Surface: A Scanning Electron Microscope Study

2020 ◽  
Vol 40 (3) ◽  
pp. 395-401 ◽  
Author(s):  
Edgard El Chaar ◽  
Mohammad Almogahwi ◽  
Kefaia Abdalkader ◽  
Abdulla Alshehri ◽  
Stephanie Cruz ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Microscope Study ◽  
Electron Microscope Study ◽  
Implant Surface ◽  
Scanning Electron Microscope Study ◽  
Scanning Electron

scholarly journals Changes in the surface of bone and acid-etched and sandblasted implants following implantation and removal

2016 ◽  
Vol 10 (01) ◽  
pp. 077-081 ◽  
Author(s):  
Cennet Neslihan Eroglu ◽  
Abdullah Seckin Ertugrul ◽  
Murat Eskitascioglu ◽  
Gurcan Eskitascioglu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dental Implant ◽  
Bovine Bone ◽  
Implant Surface ◽  
Implant Materials ◽  
Scanning Electron

ABSTRACT Objective: The aim of this study was to determine whether there are any changes in the surface of bone or implant structures following the removal of a screwed dental implant. Materials and Methods: For this, six individual samples of acid-etched and sandblasted implants from three different manufacturers’ implant systems were used. They were screwed in a D1 bovine bone, and they were removed after primary stabilization. The bone and implant surfaces are evaluated with scanning electron microscope. Results: Through examination of the surfaces of the bone prior to implantation and of the used and unused implant surfaces, it was found that inhomogeneity in the implant surface can cause microcracking in the bone. Conclusions: This is attributed to the stress induced during the implantation of self-tapping implants and suggests that a tap drill may be required in some instances to protect the implant surface.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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