Picosecond laser structuring of monocrystalline silicon surface

2013 ◽  
Author(s):  
Igor Guk ◽  
Galina Shandybina ◽  
Eugeny Yakovlev ◽  
Leonid Golovan
Keyword(s):  
Silicon Surface ◽  
Picosecond Laser ◽  
Monocrystalline Silicon ◽  
Laser Structuring

Monolithic interconnection of CIGSSe solar cells by picosecond laser structuring

2010 ◽  
Author(s):  
Gerhard Heise ◽  
Christian Hellwig ◽  
Thomas Kuznicki ◽  
Sebastian Sarrach ◽  
Christian Menhard ◽  
...  
Keyword(s):  
Solar Cells ◽  
Picosecond Laser ◽  
Laser Structuring

Nanoscratching-Induced Phase Tansformation of Monocrystalline Silicon – The Depth-of-Cut Effect

2009 ◽  
Vol 76-78 ◽  
pp. 387-391 ◽  
Author(s):  
Kausala Mylvaganam ◽  
Liang Chi Zhang
Keyword(s):  
Molecular Dynamics ◽  
Phase Transformations ◽  
Amorphous Silicon ◽  
Significant Influence ◽  
Crystalline Phase ◽  
Silicon Surface ◽  
Monocrystalline Silicon ◽  
Depth Of Cut ◽  
Initial Impression ◽  
Dynamics Simulations

This paper explores the effect of the depth-of-cut of an indenter on the phase transformations during nanoscratching on monocrystalline silicon on the Si(100) orientation. The analysis was carried out by molecular dynamics simulations. It was found that the depth-of-cut and the impingement direction of the indenter had a significant influence on the phase transformations in the initial impression region. At a relatively low depth-of-cut, only amorphous silicon was formed on the scratched surface. When the indenter impinged on a silicon surface with an angle, a bct5-Si crystalline phase in the initial impression region would emerge.

Anti-friction property of surface patterning nano-hard film on the monocrystalline silicon surface

2014 ◽  
Vol 66 (1) ◽  
pp. 131-142 ◽  
Author(s):  
Chen Wengang ◽  
Ge Shirong ◽  
Pang Lianyun ◽  
Zhang Yonghai
Keyword(s):  
Silicon Surface ◽  
Surface Patterning ◽  
Laser Surface ◽  
Monocrystalline Silicon ◽  
Friction Property ◽  
Surface Processing ◽  
Content Type ◽  
Dlc Film ◽  
Processing Equipment ◽  
Low Load

Purpose – Three types of pattern on the monocrystalline silicon surface were prepared by using laser surface processing equipment. The DLC film and Si-DLC film on the patterning surface were deposited by using PECVD-2D plasma chemical vapor deposition sets. The paper aims to discuss these issues. Design/methodology/approach – The tribological properties of the films were investigated by using the UMT-2 micro friction and wear tester. The surface topography, composition, hardness and elastic modular of the films were determined by Raman spectrum, nano mechanics tester and three-dimensional topography instrument. The worn surface topographies of the surface patterning films were tested by scanning electron microscopy. Findings – The results show that the patterning monocrystalline silicon substrate surface has good anti-friction property under low load. The patterning DLC film and Si-DLC film surface have very good anti-friction property under all the test loads. The reason of these results is that the surface patterning film not only reduces the real contact area of the friction pairs but also has low surface bonding force. Originality/value – This paper prepared three kinds of microscopic patterns on the monocrystalline silicon surface by using laser surface processing equipment. And then deposited DLC film and Si-DLC film on the patterning surface. All kinds of surface patterning monocrystalline silicon had very good anti-friction property under low load. And all kinds of surface patterning nano-hard film had perfect anti-friction property under all test loads.

Texture etching of monocrystalline silicon surface with sodium hypochlorite

2013 ◽  
Vol 30 (2) ◽  
pp. 148-151 ◽  
Author(s):  
A. Lounas ◽  
A. Nait Bouda ◽  
H. Menari ◽  
Y. Belkacem ◽  
N. Gabouze
Keyword(s):  
Sodium Hypochlorite ◽  
Silicon Surface ◽  
Monocrystalline Silicon

Picosecond-laser structuring of amorphous-silicon thin-film solar modules

2013 ◽  
Vol 112 (3) ◽  
pp. 695-700 ◽  
Author(s):  
D. Canteli ◽  
I. Torres ◽  
M. Domke ◽  
C. Molpeceres ◽  
J. Cárabe ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Picosecond Laser ◽  
Silicon Thin Film ◽  
Laser Structuring

Near-field microscopy inspection of nano scratch defects on the monocrystalline silicon surface

2019 ◽  
Vol 56 ◽  
pp. 506-512 ◽  
Author(s):  
Ying Yan ◽  
Yonghao Wang ◽  
Ping Zhou ◽  
Ning Huang ◽  
Dongming Guo
Keyword(s):  
Silicon Surface ◽  
Near Field ◽  
Monocrystalline Silicon
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