Comparing digital-light-processing (DLP) and liquid-crystal-on-silicon (LCoS) technologies for high-quality 3D shape measurement

2014 ◽  
Author(s):  
Chen Gong ◽  
Beiwen Li ◽  
Kevin G. Harding ◽  
Song Zhang
Keyword(s):  
Liquid Crystal ◽  
Shape Measurement ◽  
High Quality ◽  
Digital Light Processing ◽  
3D Shape ◽  
3D Shape Measurement ◽  
Liquid Crystal On Silicon

scholarly journals Guided, Fusion-Based, Large Depth-of-field 3D Imaging Using a Focal Stack

Sensors ◽  
2019 ◽  
Vol 19 (22) ◽  
pp. 4845 ◽  
Author(s):  
Yuhao Xiao ◽  
Guijin Wang ◽  
Xiaowei Hu ◽  
Chenbo Shi ◽  
Long Meng ◽  
...  
Keyword(s):  
3D Imaging ◽  
Depth Map ◽  
Shape Measurement ◽  
Depth Range ◽  
High Quality ◽  
Large Depth ◽  
3D Shape ◽  
3D Shape Measurement ◽  
Working Volume ◽  
Focal Stack

Three dimensional (3D) imaging technology has been widely used for many applications, such as human–computer interactions, making industrial measurements, and dealing with cultural relics. However, existing active methods often require both large apertures of projector and camera to maximize light throughput, resulting in a shallow working volume in which projector and camera are simultaneously in focus. In this paper, we propose a novel method to extend the working range of the structured light 3D imaging system based on the focal stack. Specifically in the case of large depth variation scenes, we first adopted the gray code method for local, 3D shape measurement with multiple focal distance settings. Then we extracted the texture map of each focus position into a focal stack to generate a global coarse depth map. Under the guidance of the global coarse depth map, the high-quality 3D shape measurement of the overall scene was obtained by local, 3D shape-measurement fusion. To validate the method, we developed a prototype system that can perform high-quality measurements in the depth range of 400 mm with a measurement error of 0.08%.

High-quality 3D shape measurement by kernel-optimized high sinusoidal similarity dither patterns

2020 ◽  
Vol 59 (34) ◽  
pp. 10645
Author(s):  
Peng Zhou ◽  
Ning Cai ◽  
Ting Wang ◽  
Xiang-Qun Cao ◽  
Bin Lin
Keyword(s):  
Shape Measurement ◽  
High Quality ◽  
3D Shape ◽  
3D Shape Measurement

Threshold-optimized Dithering Technique for High-quality 3D Shape Measurement

2019 ◽  
Vol 48 (8) ◽  
pp. 812002
Author(s):  
孟森森 MENG Sen-sen ◽  
蔡宁 CAI Ning ◽  
林斌 LIN Bin
Keyword(s):  
Shape Measurement ◽  
High Quality ◽  
3D Shape ◽  
3D Shape Measurement

Binarized dual phase-shifting method for high-quality 3D shape measurement

2018 ◽  
Vol 57 (23) ◽  
pp. 6632 ◽  
Author(s):  
Yajun Wang ◽  
Saptarshi Basu ◽  
Beiwen Li
Keyword(s):  
Phase Shifting ◽  
Shape Measurement ◽  
Dual Phase ◽  
High Quality ◽  
3D Shape ◽  
3D Shape Measurement ◽  
Phase Shifting Method

Dynamic microscopic 3D shape measurement based on marker-embedded Fourier transform profilometry

2018 ◽  
Vol 57 (4) ◽  
pp. 772 ◽  
Author(s):  
Yan Hu ◽  
Qian Chen ◽  
Yuzhen Zhang ◽  
Shijie Feng ◽  
Tianyang Tao ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Shape Measurement ◽  
3D Shape ◽  
3D Shape Measurement ◽  
Fourier Transform Profilometry
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