Characteristics of the higher-order resonant cantilever in dynamic atomic force microscopy

2013 ◽  
Author(s):  
Yang Zhao ◽  
Qiang-xian Huang ◽  
Ke-di Shi ◽  
Huan-jie You ◽  
Hong Xie
Keyword(s):  
Atomic Force Microscopy ◽  
Higher Order ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonant Cantilever

Higher order structure of short immunostimulatory oligonucleotides studied by atomic force microscopy

2010 ◽  
Vol 110 (6) ◽  
pp. 689-693 ◽  
Author(s):  
Dionne C.G. Klein ◽  
Eicke Latz ◽  
Terje Espevik ◽  
Bjørn T. Stokke
Keyword(s):  
Atomic Force Microscopy ◽  
Higher Order ◽  
Order Structure ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Dynamic Structure of the Translocon SecYEG in Membrane

2013 ◽  
Vol 288 (23) ◽  
pp. 16848-16854 ◽  
Author(s):  
Raghavendar Reddy Sanganna Gari ◽  
Nathan C. Frey ◽  
Chunfeng Mao ◽  
Linda L. Randall ◽  
Gavin M. King
Keyword(s):  
Atomic Force Microscopy ◽  
Membrane Protein ◽  
Dynamic Structure ◽  
Higher Order ◽  
Transmembrane Helices ◽  
Force Microscopy ◽  
Atomic Force

Purified SecYEG was reconstituted into liposomes and studied in near-native conditions using atomic force microscopy. These SecYEG proteoliposomes were active in translocation assays. Changes in the structure of SecYEG as a function of time were directly visualized. The dynamics observed were significant in magnitude (∼1–10 Å) and were attributed to the two large loops of SecY linking transmembrane helices 6–7 and 8–9. In addition, we identified a distribution between monomers and dimers of SecYEG as well as a smaller population of higher order oligomers. This work provides a new vista of the flexible and dynamic structure of SecYEG, an intricate and vital membrane protein.

Characteristics of a dynamic atomic force microscopy based on a higher-order resonant silicon cantilever and experiments

Measurement ◽  
2016 ◽  
Vol 94 ◽  
pp. 31-36 ◽  
Author(s):  
Qiangxian Huang ◽  
Yang Zhao ◽  
Dan Yuan ◽  
Liansheng Zhang ◽  
Zhenying Cheng
Keyword(s):  
Atomic Force Microscopy ◽  
Higher Order ◽  
Force Microscopy ◽  
Atomic Force ◽  
Silicon Cantilever

scholarly journals Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy

2010 ◽  
Vol 107 (10) ◽  
pp. 104508 ◽  
Author(s):  
Ryan C. Tung ◽  
Thorsten Wutscher ◽  
David Martinez-Martin ◽  
Ronald G. Reifenberger ◽  
Franz Giessibl ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Higher Order ◽  
Force Microscopy ◽  
Atomic Force
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